IEC_62539-2007_IEEE_930.pdf

INTERNATIONAL STANDARD IEC62539 First edition2007-07 IEEE 930Guide for the statistical analysis of electrical insulation breakdown data Reference number IEC 62539(E):2007 IEEE Std 930-2004 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved.IEEE is a registered trademark in the U.S.Patent&Trademark Office,owned by the Institute of Electrical and Electronics Engineers,Inc.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the publisher.If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office The Institute of Electrical and Electronics Engineers,Inc 3,rue de Varemb 3 Park Avenue CH-1211 Geneva 20 US-New York,NY10016-5997 Switzerland USA Email:inmailiec.ch Email:stds-infoieee.org Web:www.iec.ch Web:www.ieee.org About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?Electropedia:www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary online.?Customer Service Centre:www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.ch Tel.:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.Guide for the statistical analysis of electrical insulation breakdown data INTERNATIONAL STANDARD IEC62539 First edition2007-07 IEEE 930Commission Electrotechnique InternationaleInternational Electrotechnical Commission LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.1.Scope.82.References.83.Steps required for analysis of breakdown data.93.1 Data acquisition.93.2 Characterizing data using a probability function.103.3 Hypothesis testing.114.Probability distributions for failure data.124.1 The Weibull distribution.124.2 The Gumbel distribution.134.3 The lognormal distribution.134.4 Mixed distributions.134.5 Other terminology.145.Testing the adequacy of a distribution.145.1 Weibull probability data.145.2 Use of probability paper for the three-parameter Weibull distribution.155.3 The shape of a distribution plotted on Weibull probability paper.165.4 A simple technique for testing the adequacy of the Weibull distribution.166.Graphical estimates of Weibull parameters.177.Computational techniques for Weibull parameter estimation.177.1 Larger data sets.177.2 Smaller data sets.188.Estimation of Weibull percentiles.199.Estimation of confidence intervals for the Weibull function.199.1 Graphical procedure for complete and censored data.209.2 Plotting confidence limits.2110.Estimation of the parameter and their confidence limits of the log-normal function.2110.1 Estimation of lognormal parameters.2110.2 Estimation of confidence intervals of log-normal parameters.2211.Comparison tests.2211.1 Simplified method to compare percentiles of Weibull distributions.2312.Estimating Weibull parameters for a system using data from specimens.23IEEE Introduction.7 FOREWORD.4 CONTENTSIEC 62539:2007(E)IEEE 930-2004(E)2 Published by IEC under licence from IEEE.2004 IEEE.All rights reserved.LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.Annex A(informative)Least squares regression.24Annex B(informative)Bibliography.48 Published by IEC under licence from IEEE.2004 IEEE.All rights reserved.Annex C(informative)List of participants.49IEC 62539:2007(E)IEEE 930-2004(E)3 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONL