IEC_62396-4-2013.pdf

IEC 62396-4 Edition 1.0 2013-09 INTERNATIONAL STANDARD Process management for avionics Atmospheric radiation effects Part 4:Design of high voltage aircraft electronics managing potential single event effects IEC 62396-4:2013(E)Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Committee in the country of the requester.If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office Tel.:+41 22 919 02 11 3,rue de Varemb Fax:+41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.Useful links:IEC publications search-www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,replaced and withdrawn publications.IEC Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications.Just Published details all new publications released.Available on-line and also once a month by email.Electropedia-www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary(IEV)on-line.Customer Service Centre-webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance,please contact the Customer Service Centre:csciec.ch.Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 62396-4 Edition 1.0 2013-09 INTERNATIONAL STANDARD Process management for avionics Atmospheric radiation effects Part 4:Design of high voltage aircraft electronics managing potential single event effects INTERNATIONAL ELECTROTECHNICAL COMMISSION R ICS 03.100.50;31.020;49.060 PRICE CODE ISBN 978-2-8322-1094-9 Registered trademark of the International Electrotechnical Commission Warning!Make sure that you obtained this publication from an authorized distributor.Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.2 62396-4 IEC:2013(E)CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope.6 2 Normative references.6 3 Terms and definitions.6 4 Potential high voltage single event effects.6 5 Quantifying single event burnout in avionics for high voltage devices.8 6 Relevant SEB data and applying it to avionics.9 6.1 SEB data from heavy ion testing is not relevant.9 6.2 SEB data from high energy neutron and proton testing.9 6.3 Calculating the SEB rate at aircraft altitudes.12 6.4 Measurement of high voltage component radiation characteristics,EPICS.12 6.5 Single event burnout due to thermal neutrons.14 6.6 Alternative semiconductor materials to silicon.15 7 Conclusion.15 Bibliography.17 Figure 1 SEB cross sections measured in 400 V and 500 V MOSFETs for WNR neutron and proton beams.10 Figure 2 SEB cross sections measured in 1 000 V MOSFETs and 1 200 V IGBTs with WNR neutron and 200 MeV proton beams.11 Figure 3 Measurement of radiation event charge and current.13 Figure 4 EPICS plot of 1 200 V diode numbers of events at currents taken at different applied voltages for a neutron fluence of approximately 3,5 109 neutrons per cm2 measured at energies greater than 10 MeV.14 Figure 5 EPICS plot of 1 200 V diode numbers of events at currents taken at 675 V (56%)and 900 V(75%)applied voltage(stress)demonstrating the difference between low and high voltage stress Fluence as per Figure 4.14 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.62396-4 IEC:2013(E)3 INTERNATIONAL ELECTROT