IEC_62562-2010.pdf

colourinside IEC 62562Edition 1.0 2010-02INTERNATIONAL STANDARD Cavity resonator method to measure the complex permittivity of low-loss dielectric plates IEC 62562:2010(E)LICENSED TO MECON LIMITED-RANCHI/BANGALORE,FOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Committee in the country of the requester.If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office 3,rue de Varemb CH-1211 Geneva 20 Switzerland Email:inmailiec.ch Web:www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?Electropedia:www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary online.?Customer Service Centre:www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.ch Tel.:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON LIMITED-RANCHI/BANGALORE,FOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.colourinside IEC 62562Edition 1.0 2010-02INTERNATIONAL STANDARD Cavity resonator method to measure the complex permittivity of low-loss dielectric plates INTERNATIONAL ELECTROTECHNICAL COMMISSION RICS 17.220 PRICE CODEISBN 2-8318-1078-5 Registered trademark of the International Electrotechnical Commission LICENSED TO MECON LIMITED-RANCHI/BANGALORE,FOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 62562 IEC:2010(E)CONTENTS FOREWORD.3 1 Scope.5 2 Measurement parameters.5 3 Theory and calculation equations.6 3.1 Relative permittivity and loss tangent.6 3.2 Temperature dependence of and tan.9 3.3 Cavity parameters.10 4 Measurement equipment and apparatus.11 4.1 Measurement equipment.11 4.2 Measurement apparatus for complex permittivity.11 5 Measurement procedure.12 5.1 Preparation of measurement apparatus.12 5.2 Measurement of reference level.12 5.3 Measurement of cavity parameters:D,H,r,c,TC.12 5.4 Measurement of complex permittivity of test specimen:,tan.14 5.5 Temperature dependence of and tan.15 Annex A(informative)Example of measured result and accuracy.16 Bibliography.20 Figure 1 Resonator structures of two types.6 Figure 2 Correction term/a.9 Figure 3 Correction terms A/A and B/B.9 Figure 4 Schematic diagram of measurement equipments.11 Figure 5 Cavity resonator used for measurement.12 Figure 6 Photograph of cavity resonator for measurement around 10 GHz.12 Figure 7 Mode chart of cavity resonator.13 Figure 8 Resonance peaks of cavity resonator.13 Figure 9 Resonance frequency f0,insertion attenuation IA0 and half-power band width fBW.14 Figure 10 Resonance frequency f0 of TE011 mode of cavity resonator with dielectric plate(D=35 mm,H=25 mm).15 Figure A.1 Measured temperature dependence of f1 and Quc.17 Figure A.2 Resonance peaks of cavity resonator clamping sapphire plate.18 Figure A.3 Measured results of temperature dependence of f0,Qu,and tan for sapphire plate.19 Table A.1 Measured results of cavity parameters.16 Table A.2 Measured results of of and tan for sapphire plate.18 LICENSED TO MECON LIMITED-RANCHI/BANGALORE,FOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.62562 IEC:2010(E)3 INTERNATIONAL ELECTROTECHNICAL COMMISION _ CAVITY RESONATOR METHOD TO MEASURE THE COMPLEX PERMITTIVITY OF LOW-LOSS DIELECTRIC PLATES FOREWORD 1)The International Electrotechnical Commission(IEC)is a worldwide organization for standardization comprising all national electrotechnical committees(IEC National Committees).The