IEC_62526-2007_IEEE_1450.1.pdf

IEC 62526Edition 1.0 2007-11INTERNATIONAL STANDARD Standard for Extensions to Standard Test Interface Language(STIL)for Semiconductor Design Environments IEC 62526:2007(E)IEEE Std.1450.1-2005 IEEE 1450.1LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved.IEEE is a registered trademark in the U.S.Patent&Trademark Office,owned by the Institute of Electrical and Electronics Engineers,Inc.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the IEC Central Office.Any questions about IEEE copyright should be addressed to the IEEE.Enquiries about obtaining additional rightsto this publication and other information requests should be addressed to the IEC or your local IEC member National Committee.IEC Central Office The Institute of Electrical and Electronics Engineers,Inc 3,rue de Varemb 3 Park Avenue CH-1211 Geneva 20 US-New York,NY10016-5997 Switzerland USA Email:inmailiec.ch Email:stds-infoieee.org Web:www.iec.ch Web:www.ieee.org About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?Electropedia:www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary online.?Customer Service Centre:www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.ch Tel.:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.IEC 62526Edition 1.0 2007-11INTERNATIONAL STANDARD Standard for Extensions to Standard Test Interface Language(STIL)for Semiconductor Design Environments INTERNATIONAL ELECTROTECHNICAL COMMISSION XFICS 25.040 PRICE CODEISBN 2-8318-9348-8 IEEE 1450.1LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.1.Overview.91.1 Scope.101.2 Purpose.112.Definitions,acronyms,and abbreviations.112.1 Definitions.112.2 Acronyms and abbreviations.123.Structure of this standard.124.STIL syntax description.134.1 Reserved words.134.2 Reserved characters.144.3 Reserved UserFunctions.154.4 Signal and group name characteristics.154.5 STIL name spaces and name resolution.165.Expressions.175.1 Constant and variable expressions.175.2 Expression delimiterssingle quotes and parentheses.175.3 Arithmetic expressionsinteger,real,time,boolean.195.4 Pattern data expressions.205.5 Expression processing.215.6 Booleanboolean_expr.265.7 Integersinteger_expr.265.8 Logic expressionslogic_expr.275.9 Real expressionsreal_expr.285.10 Addition to timing expressionstime_expr.295.11 SignalVariablessigvar_expr.305.12 Formal parameters in procedures and macros.325.13 Integer listsinteger_list.326.Statement structure and organization of STIL information.337.STIL statement.337.1 STIL syntax.347.2 STIL example.348.UserKeywords statement.348.1 UserKeywords syntax.348.2 UserKeywords example.34IEC 62526:2007(E)IEEE 1450.1-2005(E)2 IEEE Introduction.8FOREWORD.5CONTENTSPublished by IEC under licence from IEEE.2005 IEEE.All rights reserved.LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.9.Variables block.359.1 Variables block syntax.359.2 Variables example.379.3 Variables scoping.379.4 Variables synchronizing.3910.Signals block.4010.1 Signals block syntax.4010.2 Signals example.4010.3 Bracketed signal notation enhancement.4011.SignalGroups block.4311.1 SignalGroups syntax.4311.2 SignalGroups,WFCMap,and Variables example.4311.3 Default WFCMap attribute value.4411.4 Defining indexed signal groups.4412.PatternBurst block.4512.1 PatternBurst syntax.4512.2 PatternBurst example.4712.3 Tiling and synchronization of patterns.4812.4 If and While