IEC_62431-2008.pdf

IEC 62431Edition 1.0 2008-07INTERNATIONAL STANDARD Reflectivity of electromagnetic wave absorbers in millimetre wave frequency Measurement methods IEC 62431:2008(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Committee in the country of the requester.If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office 3,rue de Varemb CH-1211 Geneva 20 Switzerland Email:inmailiec.ch Web:www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?Electropedia:www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary online.?Customer Service Centre:www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.ch Tel.:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.IEC 62431Edition 1.0 2008-07INTERNATIONAL STANDARD Reflectivity of electromagnetic wave absorbers in millimetre wave frequency Measurement methods INTERNATIONAL ELECTROTECHNICAL COMMISSION XAICS 19.080;17.120;29.120.10 PRICE CODEISBN 2-8318-9895-1 Registered trademark of the International Electrotechnical Commission LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 62431 IEC:2008(E)CONTENTS FOREWORD.5 1 Scope.7 2 Normative references.7 3 Terms,definitions and acronyms.7 3.1 Terms and definitions.7 3.2 Acronyms and symbols.10 4 Specimen.12 4.1 Specimen specification.12 4.2 Reference metal plate.12 4.2.1 Material and thickness.12 4.2.2 Surface roughness.12 4.2.3 Flatness.12 4.2.4 Size and shape.12 4.3 Reference specimen for calibration.12 5 Specimen holder.13 6 Measurement equipment.13 6.1 Type of network analyzer.13 6.2 Antenna.13 6.2.1 Horn antenna.13 6.2.2 Lens antenna.13 6.3 Amplifier.13 6.4 Cable.14 7 Measurement condition.14 7.1 Temperature and environment.14 7.2 Warming up of measurement equipment.14 7.3 Electromagnetic environment.14 8 Calibration of measurement system and measurement conditions.14 8.1 Calibration of measurement system.14 8.2 Measurement conditions.14 8.2.1 Dynamic range.14 8.2.2 Setting up of the network analyzer for keeping adequate dynamic range.14 9 Horn antenna method.15 9.1 Measurement system.15 9.1.1 Configuration of the measurement system.15 9.1.2 Horn antenna.16 9.1.3 Specimen holder.16 9.1.4 Mounting of the specimen.18 9.1.5 Antenna stand.18 9.2 Measurement conditions.18 9.2.1 Measurement environment.18 9.2.2 Measuring distance.18 9.2.3 Size of specimen.18 9.3 Measurement procedures.19 10 Dielectric lens antenna method focused beam method.20 10.1 Outline.20 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.62431 IEC:2008(E)3 10.2 Measurement system.20 10.2.1 Transmitting and receiving antennas.20 10.2.2 Focused beam horn antenna.21 10.2.3 Specimen size.22 10.2.4 Reference metal plate size.22 10.2.5 Specimen holder.22 10.2.6 Method of fixing the specimen and the reference metal plate.23 10.3 Measurement procedures.23 11 Dielectric lens antenna method parallel beam method.25 11.1 Principle.25 11.1.1 Outline.25 11.1.2 Parallel EM wave beam formed using a EM wave lens.25 11.2 Measurement system.26 11.2.1 Composition of measurement system.26 11.2.2 Dielectric lens antenna.29 11.3 Specimen.29 11.3.1 Gen