IEC_62528-2007_IEEE_1500.pdf

IEC 62528Edition 1.0 2007-11INTERNATIONAL STANDARD Standard Testability Method for Embedded Core-based Integrated Circuits IEC 62528:2007(E)IEEE Std.1500-2005 IEEE 1500LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved.IEEE is a registered trademark in the U.S.Patent&Trademark Office,owned by the Institute of Electrical and Electronics Engineers,Inc.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the IEC Central Office.Any questions about IEEE copyright should be addressed to the IEEE.Enquiries about obtaining additional rightsto this publication and other information requests should be addressed to the IEC or your local IEC member National Committee.IEC Central Office The Institute of Electrical and Electronics Engineers,Inc 3,rue de Varemb 3 Park Avenue CH-1211 Geneva 20 US-New York,NY10016-5997 Switzerland USA Email:inmailiec.ch Email:stds-infoieee.org Web:www.iec.ch Web:www.ieee.org About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?Electropedia:www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary online.?Customer Service Centre:www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.ch Tel.:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.IEC 62528Edition 1.0 2007-11INTERNATIONAL STANDARD Standard testability method for embedded core-based integrated circuits INTERNATIONAL ELECTROTECHNICAL COMMISSION XFICS 31.220 PRICE CODEISBN 2-8318-9481-6 IEEE 1500LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.1.Overview.91.1Scope.101.2Purpose.102.Normative references.103.Definitions,acronyms,and abbreviations.113.1Definitions.113.2Acronyms and abbreviations.164.Structure of this standard.174.1Specifications.174.2Descriptions.185.Introduction and motivations of two compliance levels.186.Overview of the IEEE 1500 scalable hardware architecture.196.1Wrapper serial port(WSP).196.2Wrapper parallel port(WPP).196.3Wrapper instruction register(WIR).206.4Wrapper bypass register(WBY).206.5Wrapper boundary register(WBR).207.WIR instructions.217.1Introduction.217.2Response of the wrapper circuitry to instructions.137.3Wrapper instruction rules and naming convention.237.4WS_BYPASS Instruction.247.5WS_EXTEST instruction.257.6WP_EXTEST instruction.277.7Wx_EXTEST instruction.297.8WS_SAFE instruction.307.9WS_PRELOAD instruction.327.10 WP_PRELOAD instruction.327.11 WS_CLAMP instruction.347.12 WS_INTEST_RING instruction.367.13 WS_INTEST_SCAN instruction.377.14 Wx_INTEST instruction.408.Wrapper serial port(WSP).418.1WSP terminals.429.Wrapper parallel port(WPP).439.1WPP terminals.4310.Wrapper instruction register(WIR).4310.1 WIR configuration and DR selection.4310.2 WIR design.4410.3 WIR operation.4711.Wrapper bypass register(WBY).4911.1 WBY register configuration and selection.49CONTENTSIEE Introduction.7FOREWORD.4Published by IEC under licence from IEEE.2005 IEEE.All rights reserved.IEC 62528:2007(E)IEEE 1500-2005(E)2 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.11.3 WBY operation.5112.Wrapper boundary register(WBR).5212.1 WBR structure and operation.5412.2 WBR cell structure and operation.5512.3 WBR operation events.5612.4 WBR operation modes.5912.5 Parallel access to the WBR.6112.6 WBR cell naming.6312.7 WBR cell examples.6412.8 IEEE 1500 WBR example.6813.Wrapper states.7113.1 Wrapper Disabled and Wrapper Enabled states.7114.WSP timing diagram.7214.1 Specifications.721