IEC_62860-2013_IEEE_Std_1620.pdf

IEC 62860 Edition 1.0 2013-08 INTERNATIONAL STANDARD Test methods for the characterization of organic transistors and materials IEC 62860:2013(E)IEEE Std.1620-2008 IEEE Std 1620 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEEE All rights reserved.IEEE is a registered trademark in the U.S.Patent&Trademark Office,owned by the Institute of Electrical and Electronics Engineers,Inc.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the IEC Central Office.Any questions about IEEE copyright should be addressed to the IEEE.Enquiries about obtaining additional rights to this publication and other information requests should be addressed to the IEC or your local IEC member National Committee.IEC Central Office Institute of Electrical and Electronics Engineers,Inc.3,rue de Varemb 3 Park Avenue CH-1211 Geneva 20 New York,NY 10016-5997 Switzerland United States of America Tel.:+41 22 919 02 11 stds.infoieee.org Fax:+41 22 919 03 00 www.ieee.org infoiec.ch www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.Useful links:IEC publications search-www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,replaced and withdrawn publications.IEC Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications.Just Published details all new publications released.Available on-line and also once a month by email.Electropedia-www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary(IEV)on-line.Customer Service Centre-webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance,please contact the Customer Service Centre:csciec.ch.Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 62860 Edition 1.0 2013-08 INTERNATIONAL STANDARD Test methods for the characterization of organic transistors and materials INTERNATIONAL ELECTROTECHNICAL COMMISSION T ICS 07.030 PRICE CODE ISBN 978-2-8322-1014-7 Warning!Make sure that you obtained this publication from an authorized distributor.IEEE Std 1620 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.ii IEC 62860:2013(E)IEEE Std 1620-2008 Published by IEC under license from IEEE.2008 IEEE.All rights reserved.Contents 1.Overview.1 1.1 Scope.1 1.2 Purpose.1 1.3 Electrical characterization overview.2 2.Definitions,acronyms,and abbreviations.3 2.1 Definitions.3 2.2 Acronyms and abbreviations.6 3.Standard OFET characterization procedures.6 3.1 Device structures.6 3.2 Guidelines for the OFET characterization process.7 3.3 Electrical standards.8 3.4 Reporting data.11 3.5 Environmental control and standards.13 Annex A(informative)Bibliography.14 Annex B(informative)IEEE List of Participants.15 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-27-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 62860:2013(E)iii IEEE Std 1620-2008 Published by IEC under license from IEEE.2008 IEEE.All rights reserved.TEST METHODS FOR THE CHARACTERIZATION OF ORGANIC TRANSISTORS AND MATERIALS FOREWORD 1)The International Electrotechnical Commission(IEC)is a worldwide organization for standardization comprising all national electrotechnical committees(IEC National Committees).The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields.To this end and in addition to other activities,IEC publishes International Standards,Technical Specifications,Technical Reports,Publicly Available Specifications(PAS)and Guides(hereafter referred to as“IEC Publication(s)”).Their preparation is entrusted to technical committees;any IEC