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IEC_TS_61000-5-9-2009.pdf
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IEC_TS_61000 2009
IEC/TS 61000-5-9Edition 1.0 2009-07TECHNICAL SPECIFICATION Electromagnetic compatibility(EMC)Part 5-9:Installation and mitigation guidelines System-level susceptibility assessments for HEMP and HPEM IEC/TS 61000-5-9:2009(E)BASIC EMC PUBLICATION LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2009 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Committee in the country of the requester.If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office 3,rue de Varemb CH-1211 Geneva 20 Switzerland Email:inmailiec.ch Web:www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?Electropedia:www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary online.?Customer Service Centre:www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.ch Tel.:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.IEC/TS 61000-5-9Edition 1.0 2009-07TECHNICAL SPECIFICATION Electromagnetic compatibility(EMC)Part 5-9:Installation and mitigation guidelines System-level susceptibility assessments for HEMP and HPEM INTERNATIONAL ELECTROTECHNICAL COMMISSION XBICS 33.100.20 PRICE CODEISBN 2-8318-1051-0BASIC EMC PUBLICATION Registered trademark of the International Electrotechnical Commission LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 TS 61000-5-9 IEC:2009(E)CONTENTS FOREWORD.5 INTRODUCTION.7 1 Scope.8 2 Normative references.8 3 Terms and definitions.9 4 General.11 4.1 Introduction.11 4.2 Systems and subsystems.12 5 Interaction mechanisms and protection methods.13 5.1 General.13 5.2 Front-door coupling.13 5.3 Back-door coupling.13 5.4 Protection methods.14 6 Description of overall assessment methodology.14 6.1 Methodology.14 6.2 Subsystems and equipment characterization phase.16 6.3 System analysis phase.17 6.4 System test phase.17 6.4.1 General.17 6.4.2 Low-level tests.18 6.4.3 High-level testing.18 6.5 Susceptibility assessment phase.20 6.6 The use of reverberation chambers to characterise immunity.20 Annex A(informative)Classification of effect.24 Annex B(informative)Good measurement practice.27 Annex C(informative)Computational electromagnetics.30 Annex D(informative)System level assessment HEMP.33 Annex E(informative)System level assessment HPEM.35 Annex F(informative)Limitations.39 Annex G(informative)Detailed description of low-level techniques.42 Annex H(informative)Detailed description of high-level test techniques.54 Annex I(informative)Data processing and analysis.61 Bibliography.66 Figure 1 Example system architecture.12 Figure 2 Example of radiated HPEM at high frequencies 3.14 Figure 3 Methodology flowchart.15 Figure 4 Reverberation chamber results:all effects.21 Figure 5 Reverberation chamber results:susceptibilities.22 Figure 6 Frequency spectrum of several HPEM sources.23 Figure A.1 Classification of effect.24 Figure B.1 Effect of adding ferrites to connecting cable:swept frequency example.27 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.TS 61000-5-9 IEC:2009(E)3 Figure B.2 Effect of adding ferrite to connecting cable:reverberation chamber example.28 Figure B.3 Effect of adding ferrite to connecting cable:transient example(time domain).28 Fi

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