IEC_TR_61967-4-1-2005.pdf

TECHNICAL REPORT IEC TR 61967-4-1 First edition2005-02 Integrated circuits Measurement of electromagnetic emissions,150 kHz to 1 GHz Part 4-1:Measurement of conducted emissions 1 /150 direct coupling method Application guidance to IEC 61967-4 Reference number IEC/TR 61967-4-1:2005(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series.For example,IEC 34-1 is now referred to as IEC 60034-1.Consolidated editions The IEC is now publishing consolidated versions of its publications.For example,edition numbers 1.0,1.1 and 1.2 refer,respectively,to the base publication,the base publication incorporating amendment 1 and the base publication incorporating amendments 1 and 2.Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC,thus ensuring that the content reflects current technology.Information relating to this publication,including its validity,is available in the IEC Catalogue of publications(see below)in addition to new editions,amendments and corrigenda.Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication,as well as the list of publications issued,is also available from the following:IEC Web Site(www.iec.ch)Catalogue of IEC publications The on-line catalogue on the IEC web site(www.iec.ch/searchpub)enables you to search by a variety of criteria including text searches,technical committees and date of publication.On-line information is also available on recently issued publications,withdrawn and replaced publications,as well as corrigenda.IEC Just Published This summary of recently issued publications(www.iec.ch/online_news/justpub)is also available by email.Please contact the Customer Service Centre(see below)for further information.Customer Service Centre If you have any questions regarding this publication or need further assistance,please contact the Customer Service Centre:Email:custserviec.ch Tel:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.TECHNICAL REPORT IECTR 61967-4-1 First edition2005-02 Integrated circuits Measurement of electromagnetic emissions,150 kHz to 1 GHz Part 4-1:Measurement of conducted emissions 1 /150 direct coupling method Application guidance to IEC 61967-4 PRICE CODE IEC 2005 Copyright-all rights reserved No part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the publisher.International Electrotechnical Commission,3,rue de Varemb,PO Box 131,CH-1211 Geneva 20,SwitzerlandTelephone:+41 22 919 02 11 Telefax:+41 22 919 03 00 E-mail:inmailiec.ch Web:www.iec.ch X For price,see current catalogue Commission Electrotechnique InternationaleInternational Electrotechnical Commission LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 TR 61967-4-1 IEC:2005(E)CONTENTS FOREWORD.4 1 Scope.6 2 Normative references.6 3 Terms and definitions.7 4 Splitting ICs into IC function modules.9 4.1 Background.9 4.2 Benefits.9 4.3 IC function modules.9 4.4 Example matrix for splitting ICs into IC function modules.14 5 Workflow to perform IC EMC emission tests.15 5.1 Emission test philosophy.15 5.2 Flowchart of performing emission tests.15 6 Test configurations for IC function modules.16 6.1 EMC test recommendations for IC function modules.16 6.2 Port selection guide.16 6.3 Test networks at selected ports.18 6.4 Supply selection guide.22 6.5 Test networks at selected supplies.23 6.6 Parameter initialization of IC function modules for testing.24 6.7 Test parameter for performing conducted emission measurements.30 7 Test board layout recommendations.36 7.1 Common test board recommendations.36 7.2 150 network on 2 layer and multi layer PCB.36 7.3 1 network on 2 layer and multi-layer PCB.37 8 Test report.37 Annex A(normative)IEC 61967-4 test network modification.38 Annex B(informative)Trace impedance calculation.40 Annex C(informative)Examples for splitting ICs into IC function modules.42 Figure 1 Common definition of an IC function module.8 Figure 2 Flowchart of performing emission tests.15 Figure 3 Test network for IC function module line driver.18 Figure 4 Symmetrical line driver without termination(not required by bus system datasheet).18 Figure 5 Symmetrical line driver with termination required by bus system datasheet.19 Figure 6 Test network for IC function module line driver.19 Figure 7 Test network for IC function module high side driver.20 Figure 8 Test network for IC function module low side driver.21 Figure 9 Conducted emission measurement circuits for IC function module supply.23 Figu