IEC_PAS_61338-1-5-2010.pdf

IEC/PAS 61338-1-5Edition 1.0 2010-05PUBLICLY AVAILABLE SPECIFICATIONPRE-STANDARD Waveguide type dielectric resonators Part 1-5:General information and test conditions Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency IEC/PAS 61338-1-5:2010(E)Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Committee in the country of the requester.If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office 3,rue de Varemb CH-1211 Geneva 20 Switzerland Email:inmailiec.ch Web:www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?Electropedia:www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary online.?Customer Service Centre:www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.ch Tel.:+41 22 919 02 11 Fax:+41 22 919 03 00 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC/PAS 61338-1-5Edition 1.0 2010-05PUBLICLY AVAILABLE SPECIFICATIONPRE-STANDARD Waveguide type dielectric resonators Part 1-5:General information and test conditions Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency INTERNATIONAL ELECTROTECHNICAL COMMISSION RICS 31.140 PRICE CODEISBN 978-2-88910-935-7 Registered trademark of the International Electrotechnical Commission Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.2 PAS 61338-1-5 IEC:2010(E)CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references.8 3 Measurement and related parameters.8 4 Calculation equations for iR and i.9 5 Preparation of specimen.13 6 Measurement equipment and apparatus.13 6.1 Measurement equipment.13 6.2 Measurement apparatus.13 7 Measurement procedure.14 7.1 Set up of measurement equipment and apparatus.14 7.2 Measurement of reference level.14 7.3 Measurement procedure of uQ.14 7.4 Determination of i and measurement uncertainty.16 8 Example of measurement result.16 Annex A(informative)Derivation of equation(4)for iR.18 Annex B(informative)Calculation uncertainty of parameters in Figure 3.19 Bibliography.20 Figure 1 Surface resistance sR,surface conductivity s,interface resistance iR,and interface conductivity i.7 Figure 2 The 01TE mode dielectric rod resonator to measure i.9 Figure 3 Parameters chart of 0f,g,rodP and subP for reference sapphire rod.Calculation conditions:rod=9.4,d =10.00 mm and h=5.00 mm.11 Figure 4 Parameters chart of 0f,g,rodP and subP for reference(Zr,Sn)TiO4 rod.Calculation conditions:rod=39,d=14.00 mm and h=6.46 mm.12 Figure 5 Schematic diagram of measurement equipments.13 Figure 6 Schematic diagram of measurement apparatus for ri.14 Figure 7 Frequency response for reference sapphire rod with two dielectric substrates as shown in figure 2.15 Figure 8 Resonance frequency 0f,insertion attenuation 0IA and half-power band width BWf.16 Table 1 Specifications of reference rods.10 Table 2 rod and rodtan of reference rod