IEC_61788-7-2006.pdf

INTERNATIONAL STANDARD IEC61788-7 Second edition2006-10 Superconductivity Part 7:Electronic characteristic measurements Surface resistance of superconductors at microwave frequencies Reference number IEC 61788-7:2006(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series.For example,IEC 34-1 is now referred to as IEC 60034-1.Consolidated editions The IEC is now publishing consolidated versions of its publications.For example,edition numbers 1.0,1.1 and 1.2 refer,respectively,to the base publication,the base publication incorporating amendment 1 and the base publication incorporating amendments 1 and 2.Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC,thus ensuring that the content reflects current technology.Information relating to this publication,including its validity,is available in the IEC Catalogue of publications(see below)in addition to new editions,amendments and corrigenda.Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication,as well as the list of publications issued,is also available from the following:IEC Web Site(www.iec.ch)Catalogue of IEC publications The on-line catalogue on the IEC web site(www.iec.ch/searchpub)enables you to search by a variety of criteria including text searches,technical committees and date of publication.On-line information is also available on recently issued publications,withdrawn and replaced publications,as well as corrigenda.IEC Just Published This summary of recently issued publications(www.iec.ch/online_news/justpub)is also available by email.Please contact the Customer Service Centre(see below)for further information.Customer Service Centre If you have any questions regarding this publication or need further assistance,please contact the Customer Service Centre:Email:custserviec.ch Tel:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.INTERNATIONAL STANDARD IEC61788-7 Second edition2006-10 Superconductivity Part 7:Electronic characteristic measurements Surface resistance of superconductors at microwave frequencies IEC 2006 Copyright-all rights reserved No part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the publisher.International Electrotechnical Commission,3,rue de Varemb,PO Box 131,CH-1211 Geneva 20,SwitzerlandTelephone:+41 22 919 02 11 Telefax:+41 22 919 03 00 E-mail:inmailiec.ch Web:www.iec.ch V For price,see current cataloguePRICE CODE Commission Electrotechnique InternationaleInternational Electrotechnical Commission LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 61788-7 IEC:2006(E)CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references.7 3 Terms and definitions.7 4 Requirements.7 5 Apparatus.8 5.1 Measurement system.8 5.2 Measurement apparatus for Rs.9 5.3 Dielectric rods.11 6 Measurement procedure.12 6.1 Specimen preparation.12 6.2 Set-up.12 6.3 Measurement of reference level.12 6.4 Measurement of the frequency response of resonators.13 6.5 Determination of surface resistance of the superconductor and and tan of the standard sapphire rods.15 7 Precision and accuracy of the test method.16 7.1 Surface resistance.16 7.2 Temperature.17 7.3 Specimen and holder support structure.17 7.4 Specimen protection.18 8 Test report.18 8.1 Identification of test specimen.18 8.2 Report of Rs values.18 8.3 Report of test conditions.18 Annex A(informative)Additional information relating to Clauses 1 to 8.19 Bibliography.32 Figure 1 Schematic diagram of measurement system for temperature dependence of Rs using a cryocooler.8 Figure 2 Typical measurement apparatus for Rs.10 Figure 3 Insertion attenuation IA,resonant frequency f0 and half power bandwidth f,measured at T Kelvin.13 Figure 4 Reflection scattering parameters(S11 and S22).15 Figure 5 Term definitions in Table 4.17 Figure A.1 Schematic configuration of several measurement methods for the surface resistance.20 Figure A.2 Configuration of a cylindrical dielectric rod resonator short-circuited at both ends by two parallel superconductor films deposited on dielectric substrates.22 Figure A.3 Computed results of the u-v and W-v relations for TE01p mode.23 Figure A.4 Configuration of standard dielectric rods for measurement of Rs and tan.24 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.61788-7 IEC:2006(E)3 Figure A.5 Three types of dielectric resonators.24 Figure A.6 Mode chart to design TE011 resonator short-circui