IEC_61671-2012_IEEE_Std_1671.pdf

IEC 61671 Edition 1.0 2012-06 INTERNATIONAL STANDARD Automatic Test Markup Language(ATML)for Exchanging Automatic Test Equipment and Test Information via XML IEC 61671:2012(E)IEEE Std 1671-2010 IEEE Std 1671 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEEE All rights reserved.IEEE is a registered trademark in the U.S.Patent&Trademark Office,owned by the Institute of Electrical and Electronics Engineers,Inc.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the IEC Central Office.Any questions about IEEE copyright should be addressed to the IEEE.Enquiries about obtaining additional rights to this publication and other information requests should be addressed to the IEC or your local IEC member National Committee.IEC Central Office Institute of Electrical and Electronics Engineers,Inc.3,rue de Varemb 3 Park Avenue CH-1211 Geneva 20 New York,NY 10016-5997 Switzerland United States of America Tel.:+41 22 919 02 11 stds.infoieee.org Fax:+41 22 919 03 00 www.ieee.org infoiec.ch www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.Useful links:IEC publications search-www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,replaced and withdrawn publications.IEC Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications.Just Published details all new publications released.Available on-line and also once a month by email.Electropedia-www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary(IEV)on-line.Customer Service Centre-webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance,please contact the Customer Service Centre:csciec.ch.Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 61671Edition 1.0 2012-06INTERNATIONAL STANDARD Automatic Test Markup Language(ATML)for Exchanging Automatic Test Equipment and Test Information via XML INTERNATIONAL ELECTROTECHNICAL COMMISSION XNICS 25.040;35.060 PRICE CODEISBN 978-2-83220-104-6 Warning!Make sure that you obtained this publication from an authorized distributor.IEEE Std 1671Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 61671:2012 ii IEEE Std 1671-2010 Published by IEC under license from IEEE.2010 IEEE.All rights reserved.Contents 1.Overview.1 1.1 General.1 1.2 Scope.2 1.3 Purpose.2 1.4 Application.3 1.5 Conventions used in this document.4 2.Normative references.6 3.Definitions,acronyms,and abbreviations.7 3.1 Definitions.7 3.2 Acronyms and abbreviations.10 4.Automatic test system(ATS)architecture.12 4.1 Automatic test equipment(ATE).12 4.2 Test program set(TPS).15 4.3 Automatic diagnosis and testing.18 5.Automatic test markup language(ATML).19 5.1 ATS architecture elements addressed by ATML.20 6.The ATML framework.22 6.1 External interfaces.22 6.2 Internal models.23 6.3 Services.23 7.ATML specification techniques.25 7.1 ATML common element partitioning.25 7.2 ATML XML schemas.28 7.3 XML schemas and their use in ATML.28 7.4 UML models.28 8.The ATML framework subdomains.29 8.1 The ATML framework and ATML family component standards.29 8.2 ATML subdomains.29 9.ATML XML schema names and locations.36 10.ATML XML schema extensibility.39 11.Conformance.40 11.1 ATML family XML schemas.40 11.2 The ATML framework.40 Annex A(normative)XML schema style guidelines.46 A.1 Naming conventions.46 A.2 XML declaration.48 A.3 ATML namespaces.48 A.4 Versioning.50 A.5 Documentation.51 A.6 Design.52 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 61671:2012 IEEE Std 1671-2010 iii Published by