IEC_62014-5-2015.pdf

IEC 62014-5 Edition 1.0 2015-03 INTERNA TIONAL STA NDA RD Quality of Electronic and Software Intellectual Property Used in Sy stem and System on Chip(SoC)Designs IEC 62014-5:2015-03(en)IEEE Std 1734-2011 IEEE Std 1734-2011 Copyright International Electrotechnical Commission THIS PUBLICA TION IS COPYRIGHT PROTECTED Copyright 2011 IEEE All rights reserved.IEEE is a registered tr ademar k in the U.S.Patent&Trademar k Office,owned by the Institute of Electrical and Electronics Engineer s,Inc.Unless otherwise specified,no part of this publication may be reproduced or utilized in any for m or by any means,electronic or mechanical,including photocopying and microfilm,without per mission in writing from the IEC Central Office.Any questions about IEEE copyright should be addressed to the IEEE.Enquiries about obtaining additional rights to this publication and other infor mation r equests should be addressed to the IEC or your local IEC member National Committee.IEC Centr al Office Institute of Electrical and Electronics Engineer s,Inc.3,rue de Varemb 3 Par k Avenue CH-1211 Geneva 20 New Yor k,NY 10016-5997 Switzerland United States of America Tel.:+41 22 919 02 11 stds.infoieee.org Fax:+41 22 919 03 00 www.ieee.org infoiec.ch www.iec.ch About t he IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepar es and publishes Inter national Standards for all electr ical,electronic and related technologies.A bout IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sur e that you have the latest edition,a cor rigenda or an amendment might have been published.IEC Cat alogue-webstore.iec.ch/cat alogue The stand-alone application for consulting the entire bibliographical information on IEC International Standards,Technical Specifications,Technical R eports and other documents.A v ailable for PC,Mac OS,A ndroid Tablets and iPad.IEC publications search-w w w.iec.ch/searchpub The adv anced search enables to find IEC publications by a variety of criteria(reference number,text,technical committee,).It also gives information on projec ts,replaced and withdrawn publications.IEC Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications.Just Published details all new publications released.A v ailable online and also once a month by email.Elect ropedia-w w w.elect ropedia.org The worlds leading online dic tionary of elec tronic and electrical terms containing more than 30 000 terms and definitions in English and French,with equiv alent terms in 15 additional languages.Also known as the International Elec trotechnical Vocabulary (IEV)online.IEC Glossary-st d.iec.ch/glossar y More than 60 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002.Some entries hav e been collected from earlier publications of IEC TC 37,77,86 and CISPR.IEC Customer Serv ice Centre-webstore.iec.ch/csc If y ou wish to give us y our feedback on this publication or need further assistance,please contact the Customer Service Centre:csciec.ch.Copyright International Electrotechnical Commission IEC 62014-5 Edit ion 1.0 2015-03 INTER NA TIONAL STA NDA R D Quality of Electronic and Soft ware Intellectual Property Used in System and System on Chip(SoC)Designs INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040 ISBN 978-2-83222-386-4 Warning!Make sure that you obtained this publication from an authorized distributor.IEEE Std 1734-2011 R egist er ed tr ademar k of t he Int er national Electr ot echnical Commission Copyright International Electrotechnical Commission Contents 1.Over view.1 1.1 Scope.1 1.2 Pu r pose.1 1.3 Design en viron m ent.2 1.4 QIP-com plia nt en a bled implemen ta tion s.2 1.5 Con ven tion s u sed.3 1.6 Use of col or in th is sta n d a r d.6 1.7 Con ten ts of t his sta n d ar d.6 2.Nor m a tive r efer en ces.7 3.Defin ition s,a cr on y m s,a n d a bbr evia tions.7 3.1 Defin ition s.7 3.2 Acron y m s a n d a bbr evia tion s.8 4.In ter oper a bility use m od el.8 4.1 Roles a n d r espon sibilit ies.9 4.2 IP excha n ge flows.9 5.QIP sch ema str uctur es.10 5.1 QIP schema st r u ctu r e for gold en XML.10 5.2 QIP schema st r u ctu r e for th e a n swer XML.14 5.3 Toolin g r equ iremen ts for oper a tin g on gold en XML.16 5.4 R ela tion sh ip bet ween gold en XML and completed XML.20 5.5 User exten sions.21 6.Com pa tibility with VSIA QIP.22 An nex A(in forma tive)Bibliogr a ph y.24 An n ex B(n orm a tive)Sema n tic con sisten cy r ules.25 An n ex C(in for ma tive)IEEE List of Pa rticipa n t s.32 viiiPublished by IEC under license from IEEE.2011 IEEE.All rights reserved.IEC 62014-5 IEEE St d 1734-2011iCopyright International Electrotechnical Commission Published by IEC under license from IEEE.2011 IEEE.All rights reserved.IEC 62014-5 IEEE Std 1734-2011iiCopyright International Electrotechnical Commission Published by IEC under lic