IEC_61445-2012_IEEE_STd_1445.pdf

IEC 61445 Edition 1.0 2012-06 INTERNATIONAL STANDARD Digital Test Interchange Format(DTIF)IEC 61445:2012(E)IEEE Std 1445-1998 IEEE Std 1445 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 1999 IEEE All rights reserved.IEEE is a registered trademark in the U.S.Patent&Trademark Office,owned by the Institute of Electrical and Electronics Engineers,Inc.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the IEC Central Office.Any questions about IEEE copyright should be addressed to the IEEE.Enquiries about obtaining additional rights to this publication and other information requests should be addressed to the IEC or your local IEC member National Committee.IEC Central Office Institute of Electrical and Electronics Engineers,Inc.3,rue de Varemb 3 Park Avenue CH-1211 Geneva 20 New York,NY 10016-5997 Switzerland United States of America Tel.:+41 22 919 02 11 stds.infoieee.org Fax:+41 22 919 03 00 www.ieee.org infoiec.ch www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.Useful links:IEC publications search-www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,replaced and withdrawn publications.IEC Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications.Just Published details all new publications released.Available on-line and also once a month by email.Electropedia-www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary(IEV)on-line.Customer Service Centre-webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance,please contact the Customer Service Centre:csciec.ch.Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.IEC 61445 Edition 1.0 2012-06 INTERNATIONAL STANDARD Digital Test Interchange Format(DTIF)INTERNATIONAL ELECTROTECHNICAL COMMISSION XD ICS 25.040;35.060 PRICE CODE ISBN 978-2-83220-105-3 Warning!Make sure that you obtained this publication from an authorized distributor.IEEE Std 1445 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.Contents 1.Overview.11.1 Scope.11.2 Purpose.11.3 Application.12.References.23.Denitions and acronyms.23.1 Denitions.23.2 Acronyms.44.Data organization overview of the DTIF standard environment.44.1 UUT Model Group.54.2 Stimulus and Response Group.54.3 Fault Dictionary Group.54.4 Probe Group.55.File specications.65.1 HEADER le.75.2 STIMULUS le.95.3 PO_RESPONSE le.105.4 PI_NAMES le.115.5 PO_NAMES le.125.6 MAIN_MODEL le.135.7 COMPONENT_TYPE le.145.8 USER_NODE le.155.9 INPUT_PIN_NAMES le.165.10 OUTPUT_PIN_NAMES le.175.11 NEAR_FROMS_POINTERS le.185.12 NEAR_FROMS le.195.13 EVENT le.205.14 SETTLED_STATE_ONLY le.225.15 SETTLED_STATE_&_PULSES le.235.16 NODE_SOURCE le.255.17 STEPS le.265.18 F.D._POPATS le.275.19 F.D._FAULT_SIGNATURES le.285.20 F.D._PRINT_STRINGS le.305.21 TRISTATE_FROMS_POINTERS le.325.22 TRISTATE_FROMS le.335.23 PSEUDOPI_NAMES le.345.24 TIMING_SETS le.355.25 TIMING_PER_PATTERN le.375.26 PHASE_CONNECTIONS le.385.27 AUXILIARY_PIN_NAMES le.395.28 PI_FORMATS le.405.29 FORMAT_ATTRIBUTES le.41-ii-IEC 61445:2012 IEEE Std 1445-1998 Copyrighted material licensed to BR Demo by Thomson Reuters(Scientific),Inc.,,downloaded on Nov-28-2014 by James Madison.No further reproduction or distribution is permitted.Uncontrolled when printed.5.30 F.D._CROSS_REFERENCE le.425.31 PROBETAG_ DEFINITIONS le.435.32 PROBETAG_ASSIGNMENTS le.455.33 BURSTS le.465.34 STIMULUS_TEXT le.475.35 NODE_NAMES le.485.36 EVENTS_INIT le.495.37 EQUIV_FAULTS le.515.38 PROBE_DETECTION le.525.39 F.D._EQUIV_SETS le.536.Conformance.546.1 End-to-end test.546.2 Diagnostic test using fault dictionary.546.3 Diagnostic test using probe.56Annex A(informative)Implementation overview.59Ann