IEC_61671-6-2016_IEEE_Std_1671.6.pdf

IEC 61671-6 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language(ATML)test station description IEC 61671-6:2016-04(en)IEEE Std 1671.6-2015 IEEE Std 1671.6 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2015 IEEE All rights reserved.IEEE is a registered trademark in the U.S.Patent&Trademark Office,owned by the Institute of Electrical and Electronics Engineers,Inc.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from the IEC Central Office.Any questions about IEEE copyright should be addressed to the IEEE.Enquiries about obtaining additional rights to this publication and other information requests should be addressed to the IEC or your local IEC member National Committee.IEC Central Office Institute of Electrical and Electronics Engineers,Inc.3,rue de Varemb 3 Park Avenue CH-1211 Geneva 20 New York,NY 10016-5997 Switzerland United States of America Tel.:+41 22 919 02 11 stds.infoieee.org Fax:+41 22 919 03 00 www.ieee.org infoiec.ch www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.IEC Catalogue-webstore.iec.ch/catalogue The stand-alone application for consulting the entire bibliographical information on IEC International Standards,Technical Specifications,Technical Reports and other documents.Available for PC,Mac OS,Android Tablets and iPad.IEC publications search-www.iec.ch/searchpub The advanced search enables to find IEC publications by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,replaced and withdrawn publications.IEC Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications.Just Published details all new publications released.Available online and also once a month by email.Electropedia-www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing 20 000 terms and definitions in English and French,with equivalent terms in 15 additional languages.Also known as the International Electrotechnical Vocabulary(IEV)online.IEC Glossary-std.iec.ch/glossary 65 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002.Some entries have been collected from earlier publications of IEC TC 37,77,86 and CISPR.IEC Customer Service Centre-webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance,please contact the Customer Service Centre:csciec.ch.IEC 61671-6 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language(ATML)test station description INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040;35.060 ISBN 978-2-8322-3268-2 Warning!Make sure that you obtained this publication from an authorized distributor.IEEE Std 1671.6 Registered trademark of the International Electrotechnical Commission Contents 1.Overview.1 1.1 General.1 1.2 Application of this documents annexes.2 1.3 Scope.2 1.4 Application.2 1.5 Conventions used within this document.2 2.Normative references.3 3.Definitions,acronyms,and abbreviations.4 3.1 Definitions.4 3.2 Acronyms and abbreviations.5 4.SchemaTestStationDescription.xsd.6 4.1 General.6 4.2 Elements.6 4.3 Child elements.8 4.4 Complex types.9 5.SchemaTestStationInstance.xsd.10 5.1 General.10 5.2 Elements.10 5.3 Child elements.12 5.4 Complex types.12 6.ATML TestStationDescription XML schema names and locations.14 7.ATML XML schema extensibility.15 8.Conformance.16 8.1 Conformance of a TestStationDescription instance document.16 8.2 Conformance of a TestStationInstance instance document.16 Annex A(informative)IEEE download website material associated with this document.17 Annex B(informative)Users information and examples.18 B.1 Partial automatic test station.18 Annex C(informative)Glossary.21 Annex D(informative)Bibliography.22?Annex E(informative)IEEE List of Participants.23 IEC 61671-6:2016 IEEE Std 1671.6-2015-i-IEC 61671-6:2016 IEEE Std 1671.6-2015 Published by IEC under license from IEEE.2015 IEEE.All rights reserved.Standard for Automatic Test Markup Language(ATML)Test Station Description FOREWORD 1)The International Electrotechnical Commission(IEC)is a worldwide organization for standardization comprising all national electrotechnical committees(IEC National Committees).The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields.To this end and in addition