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IEC_60384-21-1-2004_cor1-2004.pdf
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IEC_60384 21 2004 _cor1
September 2004 IEC 60384-21-1(First edition 2004-06)Fixed capacitors for use in electronic equipment Part 21-1:Blank detail specification:Fixed surface mount multilayer capacitors of ceramic dielectric,Class 1 Assessment level EZ CORRIGENDUM 1 Page 6 INTRODUCTION Replace,in the last row of the table,the reference IECQ 001005 by IEC QC 001005.Page 7 Table 2 Values of capacitance and of voltage related to case sizes Replace,in the third row of the first column Rated capacitance(in pF,nF)by Rated capacitance(in pF and/or nF).Page 8 1.4 Normative references Add,to the list,the title of the following standard:IEC 60410:1973,Sampling plans and procedures for inspection by attributes Page 8 1.6 Ordering information Replace,in item c),DC by d.c.September 2004 Page 11 Table 4 Test schedule for quality conformance inspection Replace the existing text of page 11 by the following:Table 4 Test schedule for quality conformance inspection(continued)Number of specimens and number of non-conformances 2)Subclause number and test 1)D or ND Conditions of test 1)p n c Performance requirements 1)Group C inspection(periodic)Subgroup C1 D 3 12 0 8)4.15 Robustness of termination (if required)Test Ua1,Force:2,5 N Test Ub,Method 1,Force:2,5 N Number of bends:1 Visual examination No visible damage 4.9.1 Initial measurement Capacitance 4.9 Resistance to soldering heat See detail specification for the method 4.9.4 Final measurements Visual examination Capacitance As in 4.9.4 As in 4.9.4 4.16 Component solvent resistance (if required)Solvent:Solvent temperature:Method 2 Recovery:See detail specification Subgroup C2 4.8 Substrate bending test 9)Deflection:Number of bends:See detail specification 4.8.1 Initial measurement Capacitance Capacitance(with printed board in bent position)C/C 5%4.8.2 Final inspection D Visual examination 3 12 0 8)No visible damage

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