IEC60747-5-3Edition1.12009-11INTERNATIONALSTANDARDNORMEINTERNATIONALEDiscretesemiconductordevicesandintegratedcircuits–Part5-3:Optoelectronicdevices–MeasuringmethodsDispositifsdiscretsàsemiconducteursetcircuitsintégrés–Partie5-3:Dispositifsoptoélectroniques–MéthodesdemesureIEC60747-5-3:1997+A1:2002®LICENSEDTOMECONLIMITED-RANCHI/BANGALORE,FORINTERNALUSEATTHISLOCATIONONLY,SUPPLIEDBYBOOKSUPPLYBUREAU.THISPUBLICATIONISCOPYRIGHTPROTECTEDCopyright©2009IEC,Geneva,SwitzerlandAllrightsreserved.Unlessotherwisespecified,nopartofthispublicationmaybereproducedorutilizedinanyformorbyanymeans,electronicormechanical,includingphotocopyingandmicrofilm,withoutpermissioninwritingfromeitherIECorIEC'smemberNationalCommitteeinthecountryoftherequester.IfyouhaveanyquestionsaboutIECcopyrightorhaveanenquiryaboutobtainingadditionalrightstothispublication,pleasecontacttheaddressbeloworyourlocalIECmemberNationalCommitteeforfurtherinformation.Droitsdereproductionréservés.Saufindicationcontraire,aucunepartiedecettepublicationnepeutêtrereproduiteniutiliséesousquelqueformequecesoitetparaucunprocédé,électroniqueoumécanique,ycomprislaphotocopieetlesmicrofilms,sansl'accordécritdelaCEIouduComiténationaldelaCEIdupaysdudemandeur.SivousavezdesquestionssurlecopyrightdelaCEIousivousdésirezobtenirdesdroitssupplémentairessurcettepublication,utilisezlescoordonnéesci-aprèsoucontactezleComiténationaldelaCEIdevotrepaysderésidence.IECCentralOffice3,ruedeVarembéCH-1211Geneva20SwitzerlandEmail:inmail@iec.chWeb:www.iec.chAbouttheIECTheInternationalElectrotechnicalCommission(IEC)istheleadingglobalorganizationthatpreparesandpublishesInternationalStandardsforallelectrical,electronicandrelatedtechnologies.AboutIECpublicationsThetechnicalcontentofIECpublicationsiskeptunderconstantreviewbytheIEC.Pleasemakesurethatyouhavethelatestedition,acorrigendaoranamendmentmighthavebeenpublished.�CatalogueofIECpublications:www.iec.ch/searchpubTheIECon-lineCatalogueenablesyoutosearchbyavarietyofcriteria(ref...
