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IEC_60891-1987_amd1-1992_scan.pdf
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IEC_60891 1987 _amd1 1992 _scan
IECNORME?CEIINTERNATIONALE?IECINTERNATIONAL?891STANDARD?1987AMENDEMENT 1AMENDMENT 11992-06Amendement 1Procdures pour les corrections en fonctionde la temprature et de lclairement appliqueraux caractristiques I-V mesures desdispositifs photovoltaques au silicium cristallinAmendment 1Procedures for temperature and irradiancecorrections to measured I-V characteristicsof crystalline silicon photovoltaic devices CEI 1992 Droits de reproduction rservs Copyright all rights reservedBureau central de la Commission Electrotechnique Internationale 3,rue de Varemb Genve SuisseCommission Electrotechnique Internationale CODE PRIXInternational Electrotechnical Commission PRICE CODEMe nyHapoAHae 3neHTpoTexHH4ectiaa HOMHCCHAPour prix,voir catalogue en vigueurFor price,see current catalogueBLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.DIS82(BC)33Rapport de vote82(BC)58 2?891 amend.1 CEIAVANT-PROPOSLe prsent amendement a t tabli par le Comit dEtudes n 82 de la CEI:Systmes deconversion photovoltaque de lnergie solaire.Le texte de cet amendement est issu des documents suivants:Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le voteayant abouti lapprobation de cet amendement.Page 62 Procdures de correctionAjouter la dfinition de 1MR:corrig,si ncessaire,la temprature du dispositif de rfrence pendant la mesure de ImRAjouter,en haut de la page 8,les nouvelles notes suivantes:4.Si la temprature TR du dispositif de rfrence pendant une mesure diffre de plus de 2 C decelle laquelle il a t talonn,alors il convient de corriger/sR en temprature de la maniresuivante:/SR ISRO?aR(TR To)o:IsRO?est le courant de court-circuit du dispositif de rfrence la temprature laquelle il at talonnaR?est le coefficient de temprature du courant du dispositif de rfrence5.a et 13 sont les coefficients de temprature du module seul.Si le module est fourni avec unediode en srie,il convient que les corrections en temprature de la tension soient faites en ex-cluant cette diode.Si la diode nest pas accessible,il convient de fournir ses caractristiquesen fonction de la temprature.LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.DIS82(00)33Report on Voting82(CO)58891 Amend.1 IEC?-3-FOREWORDThis amendment has been prepared by IEC Technical Committee No.82:SolarPhotovoltaic Energy Systems.The text of this amendment is based on the following documents:Full information on the voting for the approval of this amendment can be found in theVoting Report indicated in the above table.Page 72?Correction proceduresAdd to the definition of MRcorrected,as necessary,to the temperature of the reference device during the measurement of IMRAdd,on the top of page 9,the following new notes:4.-If the temperature,TR,of the reference device during a measurement differs by more than 2 Cfrom the temperature at which it was calibrated,/SR should be temperature corrected as follows:ISR=/SROaR(TR-To)where:/SROis the short circuit current of the reference device at the temperature at which it wascalibrated.aR?is the current temperature coefficient of the reference device.5.-a and l3 are temperature coefficients of only the module.If the module is provided with a diodein series,the voltage temperature corrections should be applied excluding this diode.If thediode is not accessible,its characteristics vs.temperature should be provided.LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.ICS 27.160Typeset and printed by the IEC Central OfficeGENEVA,SWITZERLANDLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.

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