IEC_60759-1983_amd1-1991_scan.pdf

IECNORMEINTERNATIONALEINTERNATIONALSTAN DARDCEIIEC607591983AMENDEMENT 1AMENDMENT 11991-11Amendement 1Mthodes dessais normaliss des spectromtresdnergie X semicteurAmendment 1Standard test procedures for semiconductorX-ray energy spectrometers IEC 1991 Droits de reproduction rservs Copyright-all rights reservedInternational Electrotechnical Commission?3,rue de Varemb Geneva,SwitzerlandTelefax:+41 22 919 0300?e-mail:inmailiec.ch?IEC web site http:/www.iec.chCommission Electrotechnique InternationaleInternational Electrotechnical CommissionMcHlgyuapomian 3rleKTpoTeXHH4ecnaR HOMHCCHACODE PRIXPRICE CODEPour prix,voir catalogue en vigueurFor price,see current catalogueBLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.45(BC)19645(BC)191Procdure des Deux MoisRapport de vote-2-?759 amend.1 CEIAVANT-PROPOSLe prsent amendement a t tabli par le Comit dEtudes n 45 de la CEI:Instrumen-tation nuclaire.Le texte de cet amendement est issu des documents suivants:Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le voteayant abouti lapprobation de cet amendement.Page 547.4.1 Sources de rayonnement XRemplacer au dernier alina de ce paragraphe,page 56:.et au paragraphe 4.1 de la Publication 340 de la CEI.par:.et au paragraphe 6.3 de la Publication 973 de la CEI.LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.Two Months ProcedureReport on Voting45(CO)19645(CO)191759 Amend.1 IEC?3 FOREWORDThis amendment has been prepared by IEC Technical Committee No.45:Nuclearinstrumentation.The text of this amendment is based on the following documents:Full information on the voting for the approval of this amendment can be found in theVoting Report indicated in the above table.Page 557.4.1 X-ray sourcesReplace,in the last paragraph of this subclause,on page 57:.and Sub-clause 4.1 of IEC Publication 340.by:.and Sub-clause 6.3 of IEC Publication 973.LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.Verre normalis(tableau I)/Standard glass(Table I)Diamtre 25 mmDiameterEpaisseurThickness 3 mmRondelles dpaisseur en plastiquePlastic spacersRondelles dpaisseur en plastiquePlastic spacersFace avant du verre lafentre de la source=8 mmFront surface of glass towindow of source=8 mmFace avant du verre lafentre du dtecteur=30 mmFront surface of glass towindow of detector=30 mmRondelles dpaisseur en plastiquePlastic spacersFace avant du verreFront surface of glassFentre de la sourceWindow of sourceRondelles dpaisseur en plastiquePlastic spacersFentre du dtecteurWindow of detectorCEI-!EC 763/91-4-?759 amend.1 CEIPage 94Figure 15aRemplacer la figure existante par la nouvelle figure suivante:Replace the existing figure by the following new figure:Fig.15a.-Appareil pour la mesure des paisseurs de fentreApparatus for window thickness measurementsLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.ICS 17.240Typeset and printed by the IEC Central OfficeGENEVA,SWITZERLANDLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.