IEC60749-43Edition1.02017-06INTERNATIONALSTANDARDNORMEINTERNATIONALESemiconductordevices–Mechanicalandclimatictestmethods–Part43:GuidelinesforICreliabilityqualificationplansDispositifsàsemiconducteurs–Méthodesd'essaismécaniquesetclimatiques–Partie43:LignesdirectricesconcernantlesplansdequalificationdelafiabilitédesCIIEC60749-43:2017-06(en-fr)®colourinsideTHISPUBLICATIONISCOPYRIGHTPROTECTEDCopyright©2017IEC,Geneva,SwitzerlandAllrightsreserved.Unlessotherwisespecified,nopartofthispublicationmaybereproducedorutilizedinanyformorbyanymeans,electronicormechanical,includingphotocopyingandmicrofilm,withoutpermissioninwritingfromeitherIECorIEC'smemberNationalCommitteeinthecountryoftherequester.IfyouhaveanyquestionsaboutIECcopyrightorhaveanenquiryaboutobtainingadditionalrightstothispublication,pleasecontacttheaddressbeloworyourlocalIECmemberNationalCommitteeforfurtherinformation.Droitsdereproductionréservés.Saufindicationcontraire,aucunepartiedecettepublicationnepeutêtrereproduiteniutiliséesousquelqueformequecesoitetparaucunprocédé,électroniqueoumécanique,ycomprislaphotocopieetlesmicrofilms,sansl'accordécritdel'IECouduComiténationaldel'IECdupaysdudemandeur.Sivousavezdesquestionssurlecopyrightdel'IECousivousdésirezobtenirdesdroitssupplémentairessurcettepublication,utilisezlescoordonnéesci-aprèsoucontactezleComiténationaldel'IECdevotrepaysderésidence.IECCentralOfficeTel.:+412291902113,ruedeVarembéFax:+41229190300CH-1211Geneva20info@iec.chSwitzerlandwww.iec.chAbouttheIECTheInternationalElectrotechnicalCommission(IEC)istheleadingglobalorganizationthatpreparesandpublishesInternationalStandardsforallelectrical,electronicandrelatedtechnologies.AboutIECpublicationsThetechnicalcontentofIECpublicationsiskeptunderconstantreviewbytheIEC.Pleasemakesurethatyouhavethelatestedition,acorrigendaoranamendmentmighthavebeenpublished.IECCatalogue-webstore.iec.ch/catalogueThestand-aloneapplicationforconsultingtheentirebibliographicalinformationonIECInternationalStandar...
