IEC_60679-1-2007.pdf

INTERNATIONAL IEC STANDARD 60679-1 Third edition2007-04 Quartz crystal controlled oscillators of assessed quality Part 1:Generic specification Reference number IEC 60679-1:2007(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Committee in the country of the requester.If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office 3,rue de Varemb CH-1211 Geneva 20 Switzerland Email:inmailiec.chWeb:www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?Customer Service Centre:www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.chTel.:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.INTERNATIONAL IEC STANDARD 60679-1 Third edition2007-04 Quartz crystal controlled oscillators of assessed quality Part 1:Generic specification XC Commission Electrotechnique InternationaleInternational Electrotechnical Commission PRICE CODE For price,see current catalogueLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 60679-1 IEC:2007(E)CONTENTS FOREWORD.5 1 Scope.7 2 Normative references.7 3 Terms,definitions and general information.9 3.1 General.9 3.2 Definitions.9 3.3 Preferred values for ratings and characteristics.19 3.4 Marking.21 4 Quality assessment procedures.21 4.1 Primary stage of manufacture.21 4.2 Structurally similar components.21 4.3 Subcontracting.22 4.4 Incorporated components.22 4.5 Manufacturers approval.22 4.6 Approval procedures.22 4.7 Procedures for capability approval.23 4.8 Procedures for qualification approval.23 4.9 Test procedures.24 4.10 Screening requirements.24 4.11 Rework and repair work.24 4.12 Certified test records.24 4.13 Validity of release.24 4.14 Release for delivery.24 4.15 Unchecked parameters.25 5 Test and measurement procedures.25 5.1 General.25 5.2 Test and measurement conditions.25 5.3 Visual inspection.26 5.4 Dimensions and gauging procedures.27 5.5 Electrical test procedures.27 5.6 Mechanical and environmental test procedures.70 5.7 Endurance test procedure.76 Annex A(normative)Load circuit for logic drive.78 Annex B(normative)Latch-up test.81 Annex C(normative)Electrostatic discharge sensitivity classification.82 Bibliography.83 Figure 1 Example of the use of frequency offset.11 Figure 2 Typical frequency fluctuation characteristics.14 Figure 3 Characteristics of an output waveform.16 Figure 4 Clock signal with phase jitter.17 Figure 5 Phase jitter measures.17 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.60679-1 IEC:2007(E)3 Figure 6 Gaussian distribution of jitter.18 Figure 7 Jitter amplitude and period of jitter frequency.18 Figure 8 Jitter tolerance according to ITU-T G.825,ANSI T1.105.03,Telcordia GR-253 and ETSI EN 300462.19 Figure 9 Test circuits for insulation resistance measurements.27 Figure 10 Test circuit for voltage proof test.28 Figure 11 Test circuit for oscillator input power measurement.28 Figure 12 Test circuit for oven and oscillator input power measurement.29 Figure 13 Test circuit for measurement of output frequency,method1.30 Figure 14 Test circuit for measurement of output frequency,method 2.30 Figure 15 Test circuit for measurement of frequency/temperature characteristics.31 Figure 16 Thermal transient behaviour of typical oscillator.33 Figure 17 Generalized oscillator circuit.34 Figure 18 Test circuit for start-up behaviour and