IEC_61193-2-2007.pdf

IEC 61193-2Edition 1.0 2007-08INTERNATIONAL STANDARD Quality assessment systems Part 2:Selection and use of sampling plans for inspection of electronic components and packages IEC 61193-2:2007(E)LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEC,Geneva,Switzerland All rights reserved.Unless otherwise specified,no part of this publication may be reproduced or utilized in any form or by any means,electronic or mechanical,including photocopying and microfilm,without permission in writing from either IEC or IECs member National Committee in the country of the requester.If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,please contact the address below or your local IEC member National Committee for further information.IEC Central Office 3,rue de Varemb CH-1211 Geneva 20 Switzerland Email:inmailiec.ch Web:www.iec.ch About the IEC The International Electrotechnical Commission(IEC)is the leading global organization that prepares and publishes International Standards for all electrical,electronic and related technologies.About IEC publications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition,a corrigenda or an amendment might have been published.?Catalogue of IEC publications:www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria(reference number,text,technical committee,).It also gives information on projects,withdrawn and replaced publications.?IEC Just Published:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications.Just Published details twice a month all new publications released.Available on-line and also by email.?Electropedia:www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,with equivalent terms in additional languages.Also known as the International Electrotechnical Vocabulary online.?Customer Service Centre:www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance,please visit the Customer Service Centre FAQ or contact us:Email:csciec.ch Tel.:+41 22 919 02 11 Fax:+41 22 919 03 00 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.IEC 61193-2Edition 1.0 2007-08INTERNATIONAL STANDARD Quality assessment systems Part 2:Selection and use of sampling plans for inspection of electronic components and packages INTERNATIONAL ELECTROTECHNICAL COMMISSION RICS 31.190 PRICE CODEISBN 2-8318-9297-XLICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.2 61193-2 IEC:2007(E)CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope.6 2 Normative references.6 3 Terms and definitions.6 4 Sampling system.7 4.1 Formation and identification of lots.7 4.2 Drawing of samples.7 4.2.1 Selection of sample items.7 4.2.2 Process of sampling.7 4.3 Sampling plans.7 4.3.1 Inspection level.7 4.3.2 Sampling plan for normal inspection.8 4.3.3 Acceptance number.8 4.3.4 Tightened or reduced inspection.8 5 Acceptance and rejection.9 5.1 Acceptability criteria.9 5.2 Disposition of rejected lots.9 6 Statistical verified quality limit(SVQL).9 6.1 General.9 6.2 Calculation of the SVQL.10 Annex A(informative)Estimation of the statistical verified quality limit(SVQL)in nonconforming items per million(10-6)at a confidence limit 60%.11 Annex B(informative)Relationship between this standard and ISO 2859-1.15 Annex C(informative)Example of application of this standard(lot-by-lot inspection of assessment level EZ in IEC/TC 40).17 Bibliography.18 Table 1 Sample size.8 Table 2 Sample size code letters.9 Table 3 Coefficients for confidence level 60%(see also A.5).10 Table A.1 Statistical verified quality limits in nonconforming items per million(10-6).12 Table A.2 np with confidence limit of 60%for accumulated number of non-conforming items and coefficient CL.14 Table B.1 Sampling plans corresponding to Table 2-A of ISO 2859-1.15 Table B.2 Tabulated values for operating characteristic curves(p:per cent nonconforming).16 Table C.1 Lot-by-lot inspection of assessment level EZ IEC/TC 40.17 LICENSED TO MECON Limited.-RANCHI/BANGALOREFOR INTERNAL USE AT THIS LOCATION ONLY,SUPPLIED BY BOOK SUPPLY BUREAU.61193-2 IEC:2007(E)3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ QUALITY ASSESSMENT SYSTEMS Part 2:Selection and use of sampling plans for inspection of electronic components and packages FOREWORD 1)The International Electrotechnical Commission(IEC)is a worldwide organization for standardization comprising all national electrotechnical committees(IEC National Committees).The object of IEC is to promote international co-operation on all questions concerning standardiz