IEC_1180_1__1992.pdf

IEC 1180 PT*1 32 4844891 0512879 727 NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 11 8011 Premire dition First edition 1992-1 O Techniques des essais haute tension pour matriels basse tension Partie 1:Dfinitions,prescriptions et modalits relatives aux essais High-voltage test techniques for low-voltage equipment Part 1:Definitions,test and procedure requirements Numero de reference Reference number CEIIIEC 1 180-1 1992 Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-IEC 1180 PT*3 92 m 4844893 0512880 449 m Rvision de la prsente publication Le contenu technique des publications de la CE1 est cons-tamment revu par la Commissionafii dassurer quil reflte bien ltat ectuel de la technique.Les renseignements relatifs ce travail de&vision,ltablissement des Mitions n5visbs et aux m i s e s jour peuvent tre obtenus auprs des Comits nationaux de la C E I et en consultant les documents cidessous:Annuairedela CE1 Cataloguedespubiicationsde la CE1 Bulletin de la CE I Publi annuellement Terminologie En ce qui concerne la temiinologie gnrale,le lecteur se reportera la Publication 50 de la CEI:Vocabulaire Electroiechnique International(VEI),qui est tablie sous forme de chapitres spars traitant chacun dun sujet dfini,lIndex g-nral tant publi sparment Des dtails mmplets sur le VEI peuvent tre obtenus sur demande.La termes et dfinitions figurant dans ia prsente publication ont t soit repris du VEI.soit spcifiquement approuvs aux fins de cette publication.Symboles graphiques et littraux Pour les symboles graphiques,symboles littraux et signes dusage gnral approuvs par ia C E I,le lecteur consultem-la Publication 27 de la C E I:Symboles littraux utiliser en lectrotechnique;-la Publication 617 de la C E I Symboles graphiques pour schmas.L e s symboles e t signes contenus dans la prsente publication ont t soit repris des Publications 27 ou 617 de ia C EI,soit spkifiquement approuvs aux fins de cette publication.Publications de la C E I tablies par le mme Comit dEtudes Lattention du lecteur est attire sur le deuxime feuillet de la couvertm,qui numbt les publications de ia C E I p r+&par le Comit dEtudes qui a tabli ia pdsente publication.Revision of this publication The technical content of I E C publications is kept under con-stant review by the I E C,thus ensuring that the content reflects current technology.Information on the work of revision,the issue of revised edi-tions and amendment sheets may be obtained f r o m IEC National Committees and&om the following I E C sources:IECBuktio IECYearbmk Cataiogue o f I E C Pubkations Published yearly Terminology For general terminology.readers are referred to I E C Publi-cation 50:International Electrootechnical Vocabulary(IEV).which is issued in the form of separate chapters each dealing with a specific field,the General Index being publihed as a se-parate booklet Full details of the IEV will&supplied on request.The terms and definitions contained in the present publication have either been taken from the IEV or have been specZicdy a p v e d for the purpose of this publication.Graphical and letter symbols For graphical symbols,and ietter symbols and signs approved by the I E C for general use.readers are referred t o:-I E C Publication 27 Letter symbols t o&used in elecical technology;-I E C Publication 617:Graphical symbols for diagrams.The symbols and signs contained in the present publication have either been taken f r o m IEC Publications 27 or 617,or have been spedidy approved for the pirpose of Uiis publication.I E C publications prepared by the same Technical Committee The attention of readers is drawn to the back cover.which lists IEC publications issued by the Technical Committee which has prepared t h e present publication.Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-IEC 1180 PT*L 92 4844893 0512881 385 D NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 11 8011 Premire dition First edition 1992-1 O Techniques des essais haute tension pour matriels basse tension Partie 1:Dfinitions,prescriptions et modalits relatives aux essais High-voltage test techniques for low-voltage equipment Part 1:Definitions,test and procedure requirements Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-IEC 1180 PT*L 92 4844893 0532882 233 W-2-SOM MAI RE 1180-1 O CE1 Pages AVANT-PROPOS.8 INTRODUCTION.10 Artides SECTION 1:GNRALITS 1.1 Domaine dapplication.12 1.2 Rfrences normatives.12 SECTION 2:DFINITIONS 2.1 Technique des chocs et isolation.14 2.1.1 Choc.14 2.1.2 Claquage partiel.14 2.1.3 Distance disolement VEl 441-17-311.14 2.1.4 Ligne de fuite VEI 151-03-371.14 2.1.5 Isolation solide.14 Caractristiques relatives la dc