IEC_1215.pdf

NORMECEIINTERNATIONALEIECINTERNATIONAL1215STANDARDPremiere editionFirst edition1993-04Modules photovoltaiques(PV)au siliciumcristallin pour application terrestre-Qualification de la conception et homologationCrystalline silicon terrestrial photovoltaic(PV)modules-Design qualification and type approvalOHHedges HedOy1h H0 090 e Heuu DHO中 CEI 1993 Droits de reproduction rservs-Copyright-all rights reservedAucune partie de cette publication ne peut etre reproduite ni No pert of this publication may be reproduded or tilized inutilise sous quelque lorme que ce soil et par aucun pro-any form or by any means,electronic or mech,ou meanique,y compris photoeopieincluding photocopying and microfilm,without parmissiles microfilms,sans accord crit de ditour.in writing from the publisher.Bureau Central de la Commission Electrotechnique Intemationale 3,rue de Varemb Geneve,SuissCommission Electrotechnique InternationaleCODEIECInternational Electrotechnical CommissionPRICE CODEMemAyHapoAHaR neKTpoTexHNecHaR HMFor prce,see cumpl calogue12151EC:1993-3-CONTENTSPageFOREWORD.7Clause1Scope and object.92Normative references9113Sampling.Marking11Testing.11613Pass criteria.7Maior visual defects.13813Report.139Modifications.10 Test procedures1910.1Visual inspection1910.2Performance at STC.1910.3Insulation test.21Measurement of temperature coefficients.2110.42310.5Measurement of nominal operating cell temperature(NOCT).Performance at NOCT.4110.610.7Performance at low irradiance.434310.8Outdoor exposure test.10.9Hot-spot endurance test.455510.10 UV test.Thermal cycling test5710.1110.12Humidity-freeze test.59Damp-heat test.6510.136510.14Robustness of terminations test.6910.15Twist test,.10.16 Mechanical load test.697110.17Hail test.Tables:171-Summary of test levels.2-Ice-ball masses and test velocities73753-Impact locations1215IEC:1993-5-Figures:1-Qualification test sequence.152-NOCT correction factor.373-Reference plate394-NOCT measurement by reference-plate method395-Wind-correction factor.416-Hot-spot effect in type A cell477-Reverse characteristics478-Hot-spot effect in type B cell499-Case SP:Series-parallel connection5110-Case SPS:Series-parallel-series connection5111-Thermal cycling test5712-Humidity-freeze cycle6113-Hail-test equipment7314-Impact locations illustrated771215IEC:1993-9-CRYSTALLINE SILICON TERRESTRIALPHOTOVOLTAIC(PV)MODULES-DESIGN QUALIFICATION AND TYPE APPROVAL1Scope and objectThis International Standard lays down IEC requirements for the design qualification andtype approval of terrestrial photovoltaic modules suitable for long-term operation ingeneral open-air climates,as defined in IEC 721-2-1.It applies only to crystalline silicontypes.Standards for thin-film modules and other environments,such as marine or equatorconditions,are under consideration.This standard does not apply to modules used with concentrators.The object of this test sequence is to determine the electrical and thermal characteristicsof the module and to show,as far as is possible within reasonable constraints of cost andtime,that the module is capable of withstanding prolonged exposure in climates describedin the scope.The actual lifetime expectancy of modules so qualified will depend on theirdesign,their environment and the conditions under which they are operated.2Normative referencesThe following normative documents contain provisions which,through reference in thistext,constitute provisions of this International Standard.At the time of publication,theeditions indicated were valid.All normative documents are subject to revision,and partiesto agreements based on this International Standard are encouraged to investigate thepossibility of applying the most recent editions of the normative documents indicatedbelow.Members of IEC and IsO maintain registers of currently valid InternationalStandards.IEC 68-1:1988,Environmental testing-Part 1:General and guidanceIEC 68-2-3:1969,Environmental testing-Part 2:Tests-Test Ca:Damp heat,steadystateIEC 68-2-21:1983,Environmental testing-Part 2:Tests-Test U:Robustness of termin-ations and integral mounting devicesIEC 410:1973,Sampling plans and procedures for inspection by attributesIEC 721-2-1:1982,Classification of environmental conditions-Part 2:Environmentalconditions appearing in nature-Temperature and humidityIEC 891:1987.Procedures for temperature and irradiance corrections to measured I-Vcharacteristics of crystalline silicon photovoltaic(PV)devicesAmendment No.1(1992)IEC 904-1:1987,Photovoltaic devices-Part 1:Measurements of photovoltaic current-voltage characteristics