_STP_542-1973.pdf

Contents Introductory Remarks-G.L.Mason The Application of Multi-Channel Spectrometers to the Elemental Analysis of Oxide Materials-W.Ramsden,Applied Research Laboratories,Ltd.,Luton(Beds.),England Current Status of X-Ray Emission Analysis for the Analysis of Slags and Related Oxide-Type Materials-R.Jen-kins,Philips Electronic Instruments,Mount Vernon,N,Y.10550 Atomic Absorption Spectrophotometry in the Analysis of Slags and Oxides-M.D.Amos,Varian Techtron Pty.Ltd.,Melbourne,Australia 3171 Utility of the Optical Emission Spectrometer in the Analysis of Refractories,Slags,and Other Oxide Materials-J.R.Ryan and R.K.Scott,Garber Research Center,Harbison-Walker Refractories,Division of Dresser In-dustries,Inc.,Pittsburgh,Pa.15227 X-Ray Emission Spectrometer Analysis of Slags and Related Materials J.C.Cline and R.A.Pontello,Globe Metallurgical Corp.,Division of Interlake,Inc.,Bev-erly,Ohio 45715 Analysis of Slags by Atomic Absorption Spectrophotometry-H.G.Zelinske and D.H.Arendt,Amsted Research Labs.,Bensenviile,Ill.60106 Questions and Answers Tape 1 2 2 2 2 Side 1 1.-.con-tinued Side 2 1-con-tinued Side 2()BY AMERICAN SOCIETY FOR TESTING AND MATERIALS 1973 Copyright by ASTM Intl(all rights reserved);Sun Jan 3 21:31:53 EST 2016Downloaded/printed byUniversity of Washington(University of Washington)pursuant to License Agreement.No further reproductions authorized.STP542-EB/Mar.1973 W.Ramsden The Application of Multi-Channel Spectrometers to the Elemental Analysis of Oxide Materials z 7o-65 55 u-0 50 o 45?4O _3s 50-25 2o)i I 0 I 2 3 4 5 6 7 8 9 MILLING TIME,m,.FIG.I-Effect of particle size on emission.10 1 Copyright1973 by ASTM International www.astm.org Copyright by ASTM Intl(all rights reserved);Sun Jan 3 21:31:53 EST 2016Downloaded/printed byUniversity of Washington(University of Washington)pursuant to License Agreement.No further reproductions authorized.2 ANALYSIS OF SLAGS AND RELATED OXIDE-TYPE MATERIALS 7 I t-i j-o0 3 9 0 I|3 4.5 6?8 GRIKtDIN;TIHE.mn Influence Of Grinding Time,High Grade Sinter,Mean Of Laboratory Results.z w Ib Ca0 I t o.,13 SOz ill I,I I I I I I I&0 I 2 3 4 S 6 T 8 9 r162 T|H,mm Influence Of Grinding Time,Low Grade Sinter,/Vtean Of Laboratory Results.Fig.2 Effect Of Grind;ng Time on XRF Analysis Of Sinters.Copyright by ASTM Intl(all rights reserved);Sun Jan 3 21:31:53 EST 2016Downloaded/printed byUniversity of Washington(University of Washington)pursuant to License Agreement.No further reproductions authorized.RAMSDEN ON MULTI-CHANNEL SPECTROMETERS 3 Copyright by ASTM Intl(all rights reserved);Sun Jan 3 21:31:53 EST 2016Downloaded/printed byUniversity of Washington(University of Washington)pursuant to License Agreement.No further reproductions authorized.4 ANALYSIS OF SLAGS AND RELATED OXIDE-TYPE MATERIALS Copyright by ASTM Intl(all rights reserved);Sun Jan 3 21:31:53 EST 2016Downloaded/printed byUniversity of Washington(University of Washington)pursuant to License Agreement.No further reproductions authorized.RAMSDEN ON MULTI-CHANNEL SPECTROMETERS 5 60 40 2O Fig.5 SiO z/FIRE BRICKS SINTER BASIC 5LAG CHROME OFE 1000 2000 m volts Copyright by ASTM Intl(all rights reserved);Sun Jan 3 21:31:53 EST 2016Downloaded/printed byUniversity of Washington(University of Washington)pursuant to License Agreement.No further reproductions authorized.6 ANALYSIS OF SLAGS AND RELATED OXIDE-TYPE MATERIALS Copyright by ASTM Intl(all rights reserved);Sun Jan 3 21:31:53 EST 2016Downloaded/printed byUniversity of Washington(University of Washington)pursuant to License Agreement.No further reproductions authorized.14.i4.1 2 I 2 o.0.4 02 02 i-I I,I I I0 20 30 40 10 20 30 40 iron,per mlt.iron.per cent.FIG.7-Effect of absorption corrections on calibration for Fe in iron ores and sinter.m Z 0 Z C-r:D Z Z rT1 r-U)o m-I m Copyright by ASTM Intl(all rights reserved);Sun Jan 3 21:31:53 EST 2016Downloaded/printed byUniversity of Washington(University of Washington)pursuant to License Agreement.No further reproductions authorized.8 ANALYSIS OF SLAGS AND RELATED OXIDE-TYPE MATERIALS 1,5 1.0 0.5 Fig.8 C I L q E C lEO XRAY INT|N$1 J/o.s lo.%MgO 1.5 1.0 0.5 0.5 1.0 1.5 2.0%MgO Copyright by ASTM Intl(all rights reserved);Sun Jan 3 21:31:53 EST 2016Downloaded/printed byUniversity of Washington(University of Washington)pursuant to License Agreement.No further reproductions authorized.ARL 72 000 X-RAY O U A N T O M E T E R Fil.9 3.0 2.0 1.%Na20 Ne20 in lass 3 K W Rh tarBet X-1-ey tubs opeIeted at S O kV-40 m A cryetel R A P IP,tegcation time:60 seconas J!J I 500 1000 1500 2000(h O m z o Z C Q 0-r Z Z m I-0 0 m-4 m O Copyright by ASTM Intl(all rights reserved);Sun Jan 3 21:31:53 EST 2016Downloaded/printed byUniversity of Washington(University of Washington)pursuant to License Agreement.No further reproductions authorized.20 10/.%F ARL 72 OOO X-RAY OUAPJTORETER Fluorine in NeF/Ces F.Io 3 KW Rh target X-ray tube operated at 5D kV-40 PHD 1V-2.5 V crystal RAP Itegretion tte=60 secs 10000 mV 30 0-q(/)(/)Z m ffl g-,t m m-4 f Copyright by AS