Designation:F97–72(Reapproved2002)e1StandardPracticesforDeterminingHermeticityofElectronDevicesbyDyePenetration1ThisstandardisissuedunderthefixeddesignationF97;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.Asuperscriptepsilon(e)indicatesaneditorialchangesincethelastrevisionorreapproval.e1NOTE—WarningnoteswereeditoriallymovedintothestandardtextinMay2003.1.Scope1.1Thesepracticescoverproceduresthatwillnormallydetectandlocatethesitesofgrossleaksinelectrondevices.1.2Theseproceduresaresuitableforuseonselectedpartsduringreceivinginspectionortoverifyandlocateleakagesitesforproductioncontrol.Theyarenotquantitative;noindicationofleaksizecanbeinferredfromthetest.1.3Theseproceduresaremostsuitableforuseontranspar-entglass-encaseddevices;allmethodsareapplicabletotrans-parentpartswithaninternalcavity.MethodA,Penetrant-Capillary,isalsoapplicabletoparts,suchasterminals,endsealsorbaseassemblies,withoutaninternalcavity,andMethodC,Penetrant-PressureFollowedbyVacuum,canbeusedonopaquepartswithaninternalcavity.MethodB,Penetrant-Pressure,canalsobeusedonopaquepartswithaninternalcavityifthepartisopenedafterdyepenetrationandbeforeinspection.Partsthathaveaninternalcavitymayeithercontaingas(suchasair,nitrogen,nitrogen-heliummixture,etc.)orbeevacuated.Theseproceduresarenotsuitableforuseongrease-filledcomponents.1.4Becauseofthepossibilityofdyeentrapmentbetweenthecomponentandanattachedpart,componentswithme-chanicallyattachedparts,suchasaradiatoronapowertransistor,shouldbetestedbeforetheattachmentismadeorafterithasbeenremoved.NOTE1—AlternativemethodsfordetermininghermeticityofelectrondevicesmaybefoundinPracticesF98(see2.1)andTestMethodsF134(see2.1).1.5ThevaluesstatedinSIunitsaretoberegardedasthestandard.Thevaluesgiveninparenthesesareforinformationonly.1.6Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheus...
