METALLQGRAPHY-APRACTICALTOOLFORCORRELATINGTHESTRUCTUREANDPROPERTIESOFMATERIALSAsymposiumpresentedattheSeventy-sixthAnnualMeetingAMERICANSOCIETYFORTESTINGANDMATERIALSPhiladelphia,Pa.,25-26June1973ASTMSPECIALTECHNICALPUBLICATION557HalleAbramsandG.N.Maniar,symposiumcochairmen04-557000-28AMERICANSOCIETYFORTESTINGANDMATERIALS1916RaceStreet,Philadelphia,Pa.19103�9byAMERICANSOCIETYforTESTINGandMATERIALS1974LibraryofCongressCatalogCardNumber:74-77096NOTETheSocietyisnotresponsible,asabody,forthestatementsandopinionsadvancedinthispublication.PrintedinTallahassee,Fla.July1974SecondPrintingMay1981Baltimore,Md.ForewordThesymposiumonMetallography-APracticalToolforCorrelatingtheStructureandPropertiesofMaterials,wasgivenattheSeventy-sixthAnnualMeetingoftheAmericanSocietyforTestingandMaterialsheldinPhiladel-phia,Pa.,25-26June1973.CommitteeE-4onMetallographysponsoredthesymposium.HalleAbrams,BethlehemSteelCorporation,andG.N.Maniar,CarpenterTechnologyCorporation,presidedassymposiumcochairmen.RelatedASTMPublicationsElectronBeamMicroanalysis,STP506(1972),$3.75(04-506000-28)StereologyandQuantitativeMetallography,STP504(1972),$9.75(04-504000-28)ManualonElectronMetallography,STP547(1973),$5.25(04-547000-28)ContentsIntroduction1Structure-SensitivePropertiesofMaterialsDisclosedbyaCombinationofX-RayTopography,X-RayDiffractionAnalysis,andElectronMicroscopyMethods--SIGMUNDWEISSMANN4CombinationMethodBasedonX-RayDivergentBeamTechniques5ContributionoftheBack-ReflectionPatternstoPrecisionMeasure-mentsofInterplanarSpacings6ComputationofStress-StrainConfigurationofStrainedCrystal;ApplicationsandLimitations7X-RayLineProfileAnalysis.SelectedAreaX-RayTopographyBasedonTransmissionPatterns8LatticeDistortionsandFractureinBrittleCrystalsDisclosedbyAnomalousTransmissionofX-Rays(BorrmannEffect)10InstrumentationofX-RayDivergentBeamCombinationMethod14StudyofFractureMechanisminCrystalsbyaCombinationMethodBasedonX-RayPendello'sungFringes,Double-CrystalDiffract-ometry,TEM,andSEM16Discussion-InterplayofComponent...
