_STP_557-1981.pdf

METALLQGRAPHY-A PRACTICAL TOOL FOR CORRELATING THE STRUCTURE AND PROPERTIES OF MATERIALS A symposium presented at the Seventy-sixth Annual Meeting AMERICAN SOCIETY FOR TESTING AND MATERIALS Philadelphia,Pa.,25-26 June 1973 ASTM SPECIAL TECHNICAL PUBLICATION 557 Halle Abrams and G.N.Maniar,symposium cochairmen 04-557000-28 AMERICAN SOCIETY FOR TESTING AND MATERIALS 1916 Race Street,Philadelphia,Pa.19103?9 by AMERICAN SOCIETY for TESTING and MATERIALS 1974 Library of Congress Catalog Card Number:74-77096 NOTE The Society is not responsible,as a body,for the statements and opinions advanced in this publication.Printed in Tallahassee,Fla.July 1974 Second Printing May 1981 Baltimore,Md.Foreword The symposium on Metallography-A Practical Tool for Correlating the Structure and Properties of Materials,was given at the Seventy-sixth Annual Meeting of the American Society for Testing and Materials held in Philadel-phia,Pa.,25-26 June 1973.Committee E-4 on Metallography sponsored the symposium.Halle Abrams,Bethlehem Steel Corporation,and G.N.Maniar,Carpenter Technology Corporation,presided as symposium cochairmen.Related ASTM Publications Electron Beam Microanalysis,STP 506(1972),$3.75(04-506000-28)Stereology and Quantitative Metallography,STP 504(1972),$9.75(04-504000-28)Manual on Electron Metallography,STP 547(1973),$5.25(04-547000-28)Contents Introduction 1 Structure-Sensitive Properties of Materials Disclosed by a Combination of X-Ray Topography,X-Ray Diffraction Analysis,and Electron Microscopy Methods-SIGMUND WEISSMANN 4 Combination Method Based on X-Ray Divergent Beam Techniques 5 Contribution of the Back-Reflection Patterns to Precision Measure-ments of Interplanar Spacings 6 Computation of Stress-Strain Configuration of Strained Crystal;Applications and Limitations 7 X-Ray Line Profile Analysis.Selected Area X-Ray Topography Based on Transmission Patterns 8 Lattice Distortions and Fracture in Brittle Crystals Disclosed by Anomalous Transmission of X-Rays(Borrmann Effect)10 Instrumentation of X-Ray Divergent Beam Combination Method 14 Study of Fracture Mechanism in Crystals by a Combination Method Based on X-Ray Pendellosung Fringes,Double-Crystal Diffract-ometry,TEM,and SEM 16 Discussion-Interplay of Component Techniques in Combination Methods 20 Conclusions 21 X-Ray Diffraction-A Versatile,Quantitative,and Rapid Technique of Metallography-LEO ZWELL 23 Specimen Preparation 24 Elemental Analysis 25 Phase Identification 29 Other Structural Characteristics 34 Conclusion 40 The Use of Hot-Stage Microscopy in the Study of Phase Transforma-tions-a.L.BRAMFITT,A.O.BENSCOTER,J.R.KILPATRICK,AND A.a.MARDER 43 Experimental Technique 43 Heating Stage 44 Applications 54 Examination of Materials by Coherent Light Techniques-R.J.SCHAEFER,J.A.BLODGETT,AND M.E.GLICKSMAN 71 Coherence 72 Optical Transforms 72 Holography 75 Optical Correlation 84 Summary 84 The Electron Microprobe as a Metallographic Tool-J.I.GOLDSTEIN 86 Electron Microprobe 87 Elemental Analysis 94 Scanning Electron Probe 103 Characterization of Phases 108 EMP Analysis of Phases 115 Extension of Instrument Capability 120 Transmission Electron Microscopy in Materials Research-M.G.H.WELLS AND J.M.CAPENOS 137 Instrument Design Improvements 141 New Observation Techniques 141 Use of TEM in Structure-Property Relationships 144 High Voltage Electron Metallography-Achievements and Prospects-A.SZIRMAE AND R.M.FISHER 169 Characteristics of High Voltage Microscopy 171 Applications 184 Future Developments 196 Microstructure Approach to Property Optimization in Wrought Super-alloys-D.R.MUZYKA AND G.N.MANIAR 198 Alloys 199 Primary Manufacturing Steps 201 Phases in Wrought Superalloys and Metallographic Techniques 203 Microstructures and Properties 205 Recent Developments 206 Micrograin Processing 206 Structure Control Heat Treating 208 Minigrain Processing 210 Thermomechanical Processing 212 Summary 217 Phase Separation as a Technique for the Characterization of Superalloys-0.H.KRIEGE 220 Specific Techniques for Phase Separation 221 Analysis of Separated Phases 225 Application of Phase Separation to Metallurgical Studies 227 Summary 233 STP557-EB/Jul.1974 Introduction In the last several years the characterization of materials by metallographic techniques has been paralleled by a remarkable improvement in material capabilities.The ability to measure and characterize those material parameters that provide improved mechanical and physical properties has led directly to the development of new and better materials.Well known metallographic techniques such as hot-stage microscopy,transmission electron microscopy(TEM),and X-ray analysis,as well as the more recent techniques of scanning electron microscopy(SEM)and automatic quantitative metallography have provided the means to measure,characterize,statistically interpret,and,final-ly,predict the properties of materials.The successful correlation of the structure and properties of materials,whether on a theoretical or empirical leve