ASTM_F_2853_-_10e1.pdf

Designation:F2853101Standard Test Method forDetermination of Lead in Paint Layers and Similar Coatingsor in Substrates and Homogenous Materials by EnergyDispersive X-Ray Fluorescence Spectrometry Using MultipleMonochromatic Excitation Beams1This standard is issued under the fixed designation F2853;the number immediately following the designation indicates the year oforiginal adoption or,in the case of revision,the year of last revision.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon()indicates an editorial change since the last revision or reapproval.1NOTESection 7.1.3 was changed editorially from“.$than 250 eV.”to correctly read“.equal to or better than 250eV.”in July 2011.1.Scope1.1 This test method uses energy dispersive X-ray fluores-cence(EDXRF)spectrometry for detection and quantificationof lead(Pb)in paint layers,similar coatings,or substrates andhomogenous materials.The following material types weretested in the interlaboratory study for this standard test method:ABS plastic,polyethylene,polypropylene,PVC,glass,zincalloy,wood,and fabric.1.2 This technique may also be commonly referred to asHigh Definition X-ray Fluorescence(HDXRF)or MultipleMonochromatic Beam EDXRF(MMB-EDXRF).1.3 This test method is applicable for the products andmaterials described in 1.1 for a Pb mass fraction range of 14 to1200 mg/kg for uncoated samples and 30 to 450 mg/kg forcoated samples,as specified in Table 1 and determined by aninterlaboratory study using representative samples1.4 Ensure that the analysis area of the sample is visuallyuniform in appearance and at least as large as the X-rayexcitation beam at the point of sample excitation.1.5 For coating analysis,this test method is limited to paintand similar coatings.Metallic coatings are not covered by thistest method.1.6 X-ray NomenclatureThis standard names X-ray linesusing the IUPAC convention with the Siegbahn convention inparentheses.1.7 There are no known ISO equivalent methods to thisstandard.1.8 The values stated in SI units are to be regarded asstandard.No other units of measurement are included in thisstandard.1.9 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2.Referenced Documents2.1 ASTM Standards:2D883 Terminology Relating to PlasticsD6299 Practice for Applying Statistical Quality Assuranceand Control Charting Techniques to Evaluate AnalyticalMeasurement System PerformanceE135 Terminology Relating to Analytical Chemistry forMetals,Ores,and Related MaterialsE691 Practice for Conducting an Interlaboratory Study toDetermine the Precision of a Test MethodF2576 Terminology Relating to Declarable Substances inMaterials3.Terminology3.1 DefinitionsDefinitions of terms applying to XRF,plas-tics and declarable substances appear in Terminology D883,E135,and F2576.3.2 Definitions of Terms Specific to This Standard:3.2.1 Compton scatteringthe inelastic scattering of anX-ray photon through its interaction with the bound electronsof an atom.This process is also referred to as incoherentscattering.3.2.2 fundamental parameters(FP)modela model forcalibration of X-ray fluorescence response,including the cor-rection of matrix effects,based on the theory describing thephysical processes of the interactions of X-rays with matter.1This test method is under the jurisdiction of ASTM Committee F40 onDeclarable Substances in Materials and is the direct responsibility of SubcommitteeF40.01 on Test Methods.Current edition approved July 1,2010.Published July 2010.DOI:10.1520/F28531001.2For referenced ASTM standards,visit the ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards volume information,refer to the standards Document Summary page onthe ASTM website.Copyright ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959.United States1 3.2.3 homogenous materialmaterials are considered ho-mogenous when the elemental composition as determined bythe technique in this test method is independent with respect tothe measured location on the specimen and among separatespecimens prepared from the same material.3.2.4 low energy monochromatic beama focused mono-chromatic beam having its selected photon energy between 3and 9 keV.3.2.5 medium energy monochromatic beama focusedmonochromatic beam having its selected photon energy be-tween 15 and 23 keV.3.2.6 monochromatic beaman incident monochromaticbeam on a sample having a selected photon energy with anarrow energy bandwidth relative to the selected energy.Method precision is achieved with a monochromatic beamhaving an energy bandwidth(Full Width Half Maximum)lessthan 61.5%relative to the selected energy and containingmore than 98%flux of the spectrum of the excitation beamwhich is incident on the sa