Designation:F1893−11GuideforMeasurementofIonizingDose-RateSurvivabilityandBurnoutofSemiconductorDevices1ThisstandardisissuedunderthefixeddesignationF1893;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.Asuperscriptepsilon(´)indicatesaneditorialchangesincethelastrevisionorreapproval.1.Scope1.1Thisguidedefinesthedetailedrequirementsfortestingsemiconductordevicesforshort-pulsehighdose-rateionization-inducedsurvivabilityandburnoutfailure.Thetestfacilityshallbecapableofprovidingthenecessarydoseratestoperformthemeasurements.Typically,largeflashX-ray(FXR)machinesoperatedinthephotonmode,orFXRe-beamfacilitiesareutilizedbecauseoftheirhighdose-ratecapabili-ties.ElectronLinearAccelerators(LINACs)maybeusedifthedoserateissufficient.Twomodesoftestaredescribed:(1)Asurvivabilitytest,and(2)Aburnoutfailureleveltest.1.2ThevaluesstatedinInternationalSystemofUnits(SI)aretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.2.ReferencedDocuments2.1ASTMStandards:2E170TerminologyRelatingtoRadiationMeasurementsandDosimetryE668PracticeforApplicationofThermoluminescence-Dosimetry(TLD)SystemsforDeterminingAbsorbedDoseinRadiation-HardnessTestingofElectronicDevicesE1894GuideforSelectingDosimetrySystemsforApplica-tioninPulsedX-RaySourcesF526TestMethodforUsingCalorimetersforTotalDoseMeasurementsinPulsedLinearAcceleratororFlashX-rayMachines2.2ISO/ASTMStandard:251275PracticeforUseofaRadiochromicFilmDosimetrySystem3.Terminology3.1Definitions:3.1.1burnoutfailureleveltest—atestperformedtodeter-minethemaximumdose-ratelevelthedevicesurvivesandtheminmumdose-ratelevelwherethedeviceexperiencesburnout.3.1.1.1Discussion—Insuchatest,semiconductordevicesareexposedtoaseriesofirradiationsofincreasingdose-ratelevels.Themaximumdoserateatwhichthedevicesurvivesisdeterminedforworst-casebiasconditions.Theburnoutfailureleveltestisalwaysadestructivetest.3.1.2doserate—th...
