Designation:F980−10´1StandardGuideforMeasurementofRapidAnnealingofNeutron-InducedDisplacementDamageinSiliconSemiconductorDevices1ThisstandardisissuedunderthefixeddesignationF980;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.Asuperscriptepsilon(´)indicatesaneditorialchangesincethelastrevisionorreapproval.ε1NOTE—Figure2wascorrectededitoriallyinOctober2014.1.Scope1.1Thisguidedefinestherequirementsandproceduresfortestingsilicondiscretesemiconductordevicesandintegratedcircuitsforrapid-annealingeffectsfromdisplacementdamageresultingfromneutronradiation.Thistestwillproducedegra-dationoftheelectricalpropertiesoftheirradiateddevicesandshouldbeconsideredadestructivetest.Rapidannealingofdisplacementdamageisusuallyassociatedwithbipolartech-nologies.1.1.1Heavyionbeamscanalsobeusedtocharacterizedisplacementdamageannealing(1)2,butionbeamshavesignificantcomplicationsintheinterpretationoftheresultingdevicebehaviorduetotheassociatedionizingdose.Theuseofpulsedionbeamsasasourceofdisplacementdamageisnotwithinthescopeofthisstandard.1.2ThevaluesstatedinSIunitsaretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.3Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoconsultandestablishappropriatesafetyandhealthpracticesanddeter-minetheapplicabilityofregulatorylimitationspriortouse.2.ReferencedDocuments2.1ASTMStandards:3E264TestMethodforMeasuringFast-NeutronReactionRatesbyRadioactivationofNickelE265TestMethodforMeasuringReactionRatesandFast-NeutronFluencesbyRadioactivationofSulfur-32E666PracticeforCalculatingAbsorbedDoseFromGammaorXRadiationE720GuideforSelectionandUseofNeutronSensorsforDeterminingNeutronSpectraEmployedinRadiation-HardnessTestingofElectronicsE721GuideforDeterminingNeutronEnergySpectrafromNeutronSensorsforRadiation-HardnessTestingofElec-tro...
