Designation:F676–97(Reapproved2003)StandardTestMethodforMeasuringUnsaturatedTTLSinkCurrent1ThisstandardisissuedunderthefixeddesignationF676;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.Asuperscriptepsilon(e)indicatesaneditorialchangesincethelastrevisionorreapproval.1.Scope1.1Thistestmethodcoversthemeasurementoftheunsat-uratedsinkcurrentoftransistor-transistorlogic(TTL)devicesunderspecifiedconditions.1.2Units—ThevaluesstatedintheInternationalSystemofUnits(SI)aretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.3Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappro-priatesafetyandhealthpracticesanddeterminetheapplica-bilityofregulatorylimitationspriortouse.2.ReferencedDocuments2.1ASTMStandards:E178PracticeforDealingwithOutlyingObservations23.SummaryofTestMethod3.1Inputandbiasvoltagelevelsandanyrequiredinputsignalsareappliedtothedeviceundertesttoputtheoutputtobetestedinthelow-levelstate.Voltagepulsesofsufficientmagnitudetopulltheoutputtransistoroutofsaturationareappliedtotheoutputpinundertest.Thecorrespondingcurrentpulsesaremeasured.3.2Thefollowingtestconditionsarenotspecifiedbythetestmethodandshallbeagreeduponbythepartiestothetest:3.2.1Theoutputpin(s)tobetested,3.2.2Ambienttemperaturerange,3.2.3Supplyvoltage(s)tobeused,3.2.4Inputsequencetobeappliedbeforethedeviceoutputispulsed,3.2.5Pulsevoltagetobeappliedtotheoutputpinundertest,3.2.6Dutycycleanddurationoftheappliedpulses,and3.2.7Accuracyandtolerancesrequiredforsupplyvolt-age(s),inputvoltages,pulsevoltage,currentmeasurement,dutycycle,andpulse-width.4.SignificanceandUse4.1UnsaturatedsinkcurrentisaspecialparameterthatiscloselyrelatedtothegainoftheoutputtransistorofTTLcircuits.ThisparameterisparticularlyusefulinevaluatingneutrondegradationinTTLdevicesbecauseitchangessmoothl...
