ASTM_F_1262M_-_14.pdf

Designation:F1262M14Standard Guide forTransient Radiation Upset Threshold Testing of DigitalIntegrated Circuits(Metric)1This standard is issued under the fixed designation F1262M;the number immediately following the designation indicates the year oforiginal adoption or,in the case of revision,the year of last revision.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon()indicates an editorial change since the last revision or reapproval.1.Scope1.1 This guide is to assist experimenters in measuring thetransient radiation upset threshold of silicon digital integratedcircuits exposed to pulses of ionizing radiation greater than 103Gy(matl.)/s.1.1.1 DiscussionThis document is intended to be a guideto determine upset threshold,and is not intended to be astand-alone document.1.2 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2.Referenced Documents2.1 ASTM Standards:2E666 Practice for Calculating Absorbed Dose From Gammaor X RadiationE668 Practice for Application of Thermoluminescence-Dosimetry(TLD)Systems for Determining AbsorbedDose in Radiation-Hardness Testing of Electronic DevicesF1893 Guide for Measurement of Ionizing Dose-Rate Sur-vivability and Burnout of Semiconductor Devices2.2 Military Standards:3Method 1019 in MIL-STD-883.Steady-State Total DoseIrradiation ProcedureMethod 1021 in MIL-STD-883.Dose Rate Threshold forUpset of Digital Microcircuits.3.Terminology3.1 Definitions:3.1.1 combinational logicA digital logic system with theproperty that its output state at a given time is solely deter-mined by the logic signals at its inputs at the same time(exceptfor small time delays caused by the propagation delay ofinternal logic elements).3.1.1.1 DiscussionCombinational circuits contain no in-ternal storage elements.Hence,the output signals are not afunction of any signals that occurred at past times.Examples ofcombinational circuits include gates,adders,multiplexers anddecoders.3.1.2 latchup conditionA persistent anomalous high cur-rent state in which a parasitic region(for example,a four layerp-n-p-n or n-p-n-p path)is turned on by transient ionizingradiation.3.1.3 over-stressed deviceA device that has conductedmore than the manufacturers specified maximum current,ordissipated more than the manufacturers specified maximumpower.3.1.3.1 DiscussionIn this case the DUT is considered tobe overstressed even if it still meets all of the manufacturersspecifications.Because of the overstress,the device should beevaluated before using it in any high reliability application.3.1.4 primary photocurrent(Ipp)a transient current flow-ing from the DUT due to radiation exposure.3.1.4.1 DiscussionThe passage of radiation through thedepletion region of a semiconductor device creates electron-hole pairs.These electron-hole pairs are then subsequentlyswept out of the device via the built in potential.This results ina transient current flowing from the DUT due to radiationexposure.3.1.5 sequential logicA digital logic system with theproperty that its output state at a given time depends on thesequence and time relationship of logic signals that werepreviously applied to its inputs.3.1.5.1 DiscussionExamples of sequential logic circuitsinclude flip-flops,shift registers,counters,and arithmetic logicunits.3.1.6 state vectorA vector which completely specifies thelogic condition of all elements within a logic circuit.3.1.6.1 DiscussionFor combinational circuits,the statevector includes the logic signals that are applied to all inputs:1This guide is under the jurisdiction of ASTM Committee F01 on Electronicsand is the direct responsibility of Subcommittee F01.11 on Nuclear and SpaceRadiation Effects.Current edition approved June 1,2014.Published July 2014.Originally approvedin 1995.Last previous edition approved in 2008 as F1262M 95(2008).DOI:10.1520/F1262M-14.2For referenced ASTM standards,visit the ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards volume information,refer to the standards Document Summary page onthe ASTM website.3Available from Standardization Documents Order Desk,Bldg.4,Section D,700 Robbins Ave.,Philadelphia,PA 19111-5094,Attn:NPODS.Copyright ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959.United States1 for sequential circuits,the state vector must also include thesequence and time relationship of all input signals.In thisguide the output states will also be considered part of the statevector definition.For example,an elementary 4-input NANDgate has 16 possible state vectors,15 of which result in thesame output condition(“1”state).A 4-bit counter has 16possible output conditions,but many more state vectors be-cause of its dependence on the dynamic relationship