Designation:F1262M−14StandardGuideforTransientRadiationUpsetThresholdTestingofDigitalIntegratedCircuits(Metric)1ThisstandardisissuedunderthefixeddesignationF1262M;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.Asuperscriptepsilon(´)indicatesaneditorialchangesincethelastrevisionorreapproval.1.Scope1.1Thisguideistoassistexperimentersinmeasuringthetransientradiationupsetthresholdofsilicondigitalintegratedcircuitsexposedtopulsesofionizingradiationgreaterthan103Gy(matl.)/s.1.1.1Discussion—Thisdocumentisintendedtobeaguidetodetermineupsetthreshold,andisnotintendedtobeastand-alonedocument.1.2Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappro-priatesafetyandhealthpracticesanddeterminetheapplica-bilityofregulatorylimitationspriortouse.2.ReferencedDocuments2.1ASTMStandards:2E666PracticeforCalculatingAbsorbedDoseFromGammaorXRadiationE668PracticeforApplicationofThermoluminescence-Dosimetry(TLD)SystemsforDeterminingAbsorbedDoseinRadiation-HardnessTestingofElectronicDevicesF1893GuideforMeasurementofIonizingDose-RateSur-vivabilityandBurnoutofSemiconductorDevices2.2MilitaryStandards:3Method1019inMIL-STD-883.Steady-StateTotalDoseIrradiationProcedureMethod1021inMIL-STD-883.DoseRateThresholdforUpsetofDigitalMicrocircuits.3.Terminology3.1Definitions:3.1.1combinationallogic—Adigitallogicsystemwiththepropertythatitsoutputstateatagiventimeissolelydeter-minedbythelogicsignalsatitsinputsatthesametime(exceptforsmalltimedelayscausedbythepropagationdelayofinternallogicelements).3.1.1.1Discussion—Combinationalcircuitscontainnoin-ternalstorageelements.Hence,theoutputsignalsarenotafunctionofanysignalsthatoccurredatpasttimes.Examplesofcombinationalcircuitsincludegates,adders,multiplexersanddecoders.3.1.2latchupcondition—Apersistentanomaloushighcur-rentstateinwhichaparasi...
