Designation:F109−12StandardTerminologyRelatingtoSurfaceImperfectionsonCeramics1ThisstandardisissuedunderthefixeddesignationF109;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.Asuperscriptepsilon(´)indicatesaneditorialchangesincethelastrevisionorreapproval.1.Scope1.1Thisterminologydescribesandillustratesimperfectionsobservedonwhitewaresandrelatedproducts.Foradditionaldefinitionsoftermsrelatingtowhitewaresandrelatedproducts,refertoTerminologyC242.Toobservethesedefects,examinationshallbeperformedvisually,withorwithouttheaidofadyepenetrant,asdescribedinTestMethodC949.Agreementbythemanufacturerandthepurchaserregardingspecifictechniquesofobservationisstronglyrecommended.2.ReferencedDocuments2.1ASTMStandards:2C242TerminologyofCeramicWhitewaresandRelatedProductsC949TestMethodforPorosityinVitreousWhitewaresbyDyePenetrationE165PracticeforLiquidPenetrantExaminationforGeneralIndustry3.Terminologyblemish—strainedordiscoloredareaattributabletonormalcompositionorforming,orboth.(Seealsoinclusion.)blister—bubbleorgaseousinclusionatthesurfacewhichifbrokencouldformapit,pock,orhole.burr—fragmentofexcessmaterialorforeignparticleadheringtothesurface.camber—asinglearchofcurvature.(Seealsowaviness.)chip—areaalonganedgeorcornerwherethematerialhasbrokenoff.where:w=widthl=length,andd=depth.closedchip—fracturedareaontheedgeorcornerwhenthematerialhasnotbrokenoff(Syn.potentialchip).1ThisterminologyisunderthejurisdictionofASTMCommitteeC21onCeramicWhitewaresandRelatedProductsandisthedirectresponsibilityofC21.01EditorialandTeminologyonNomenclature.CurrenteditionapprovedJan.15,2012.PublishedFebruary2012.Originallyapprovedin1969.Lastpreviouseditionapproved2009asF109–04(2009).DOI:10.1520/F0109-12.2ForreferencedASTMstandards,visittheASTMwebsite,www.astm.org,orcontactASTMCustomerServiceatservice@astm.org.ForAnnualBookofASTMStandardsvolumeinformation,refertothestanda...
