Designation:B734−97(Reapproved2013)StandardSpecificationforElectrodepositedCopperforEngineeringUses1ThisstandardisissuedunderthefixeddesignationB734;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginaladoptionor,inthecaseofrevision,theyearoflastrevision.Anumberinparenthesesindicatestheyearoflastreapproval.Asuperscriptepsilon(´)indicatesaneditorialchangesincethelastrevisionorreapproval.1.Scope1.1Thisspecificationcoversrequirementsforelectrodepos-itedcoatingsofcopperusedforengineeringpurposes.Ex-amplesincludesurfacehardening,heattreatmentstop-off,asanunderplateforotherengineeringcoatings,forelectromag-neticinterferences(EMI)shieldinginelectroniccircuitry,andincertainjoiningoperations.1.2Thisspecificationisnotintendedforelectrodepositedcopperwhenusedasadecorativefinish,orasanundercoatforotherdecorativefinishes.1.3Thisspecificationisnotintendedforelectrodepositedcopperwhenusedforelectroforming.2.ReferencedDocuments2.1ASTMStandards:2B320PracticeforPreparationofIronCastingsforElectro-platingB374TerminologyRelatingtoElectroplatingB487TestMethodforMeasurementofMetalandOxideCoatingThicknessbyMicroscopicalExaminationofCrossSectionB499TestMethodforMeasurementofCoatingThicknessesbytheMagneticMethod:NonmagneticCoatingsonMagneticBasisMetalsB504TestMethodforMeasurementofThicknessofMetal-licCoatingsbytheCoulometricMethodB507PracticeforDesignofArticlestoBeElectroplatedonRacksB568TestMethodforMeasurementofCoatingThicknessbyX-RaySpectrometryB571PracticeforQualitativeAdhesionTestingofMetallicCoatingsB588TestMethodforMeasurementofThicknessofTrans-parentorOpaqueCoatingsbyDouble-BeamInterferenceMicroscopeTechniqueB602TestMethodforAttributeSamplingofMetallicandInorganicCoatingsB678TestMethodforSolderabilityofMetallic-CoatedProductsB697GuideforSelectionofSamplingPlansforInspectionofElectrodepositedMetallicandInorganicCoatingsB762TestMethodofVariablesSamplingofMetallicandInorganicCoatingsB765GuideforSelectionofPorosityandGrossDefectTestsforElectrodepositsandRelatedMetal...
