ASTM_DS37A-1970.pdf

X-RAY EMISSION AND ABSORPTION WAVELENGTHS AND TWO-THETA TABLES SECOND EDITION Sponsored by ASTM Committee E-2 on Emission spectroscopy Prepared by E.W.WHITE G.G.JOHNSON,JR.ASTM Data series DS 37A Price$54.00#AMERICAN SOCIETY FOR TESTING AND MATERIALS 1916 Race Street Philadelphia,Pa.19103 BY AMERICAN SOCIETY FOR TESTING AND MATERIALS 1970 Library of Congress No.72-115226 ISBN 0-8031-2005-2 NOTE The Society is not responsible,as a body,for statements and opinions advanced in this publication Printed in U.S.A.May 1970 contents PAGE Foreword iv Two-Theta Table I 1 Periodic Table 47 Two-Theta Table II 51 Foreword X-ray emission spectrography(X-ray fluorescence)and the electron microprobe are two basic techniques for elemental chemical analysis.X-ray fluorescence instruments are now used routinely for the deter-mination of all elements fluorine and heavier.The more efficient X-ray excitation by electrons used in the microprobe makes it feasible to work with all elements boron and heavier.Lithium and beryllium also can be detected in the microprobe although not as readily as the heavier elements.Fundamental to the successful use of these techniques is the proper application of X-ray emission line and absorption edge wave-length data,together with calculated values for the Bragg diffraction angles of the analyzing crystals.The trend is toward the analysis of specimens having increasing complex chemistry as well as toward utilization of X-ray emission line shifts(soft X-ray spectroscopy)to determine how elements are chemically bonded in a given specimen.These developments have created a need for reference tables in con-venient form.This volume is the second edition of such tables.It pro-vides a listing of all X-ray emission lines(160 A*and shorter),incor-porating some 3400 first order lines,absorption edges,and the calcu-lated two-theta values for 23 commonly used analyzing crystals.Since publication of the first edition as ASTM Data Series DS 37,X-Ray Emission Line Wavelength and Two-Theta Tables in 1965,I1 several developments have stimulated preparation of a new edition.Taken singly,perhaps none of these developments would warrant a new edition,but together they represent a major advancement over the earlier version.New analyzing crystals are being developed continually.The most important recent advances have been made with materials that are not single crystals in the usual sense.These include increased use of the so-called pseudo-crystals or Langmuir-Blodgett preparations of soap films.Lead stearate continues to be the most commonly used pseudo-crystal,although the laurates and lignocerates are now commonly used also.The newly developed synthetic graphite sold by Union Carbide under the trade name Ucar 2 may be the precursor to an important new family of analyzing materials.This graphite is really a highly oriented polycrystalline material giving a rather broad rocking curve(0.4 deg),but its very high reflection efficiency more than offsets this JThe italic numbers in brackets refer to the list of references appended to this Foreword.limitation for many applications.Clinochlore is now in extensive use especially in microprobe applications where it is suited ideally to the analysis of oxygen 3.Its mechanical and chemical stability are par-ticularly useful in soft X-ray applications.Another trend in analyzer crystal usage is to employ more than one orientation of the same crys-tal.This has become especially popular for LiF,ADP,EDDT,and quartz.The X-ray line designations and column headings have been ren-dered much more readable in this edition,thanks to the availability of a special IBM print train.This train,owned by the Joint Committee on Powder Diffraction Standards,carries most of the Greek letters as well as large and small type,upper and lower case,and prime characters.As a result the table has the appearance of being printed from set type.The situation with regard to satellite lines has been reviewed ex-tensively.It was decided to delete most of the satellite lines given in DS-37 from this table.The reason is that apparently most of them were identified originally from X-ray films in which they were recog-nized as undulations in intensity within emission bands or broad wave-length tails.The identification of many of them as real satellite lines is now in doubt.Correctional formulas are being used more and more in quanti-tative X-ray fluorescence and electron microprobe analysis.Funda-mental to all these correctional formulas is knowledge of the X-ray absorption edge wavelength(energies)for each of the elements in a given matrix.Tabulations of absorption edges are usually quite sep-arate from the emission line wavelength tables.This edition integrates the absorption edges in a manner that makes them quite easily retrieved.This wavelength table has been compiled with the use of high resolution spectrometers in mind.It is realized that for many spec-trometers,not all of the lines listed will be resolved;but