ASTM_D_1830_-_99_2012.pdf

Designation:D183099(Reapproved 2012)Standard Test Method forThermal Endurance of Flexible Sheet Materials Used forElectrical Insulation by the Curved Electrode Method1This standard is issued under the fixed designation D1830;the number immediately following the designation indicates the year oforiginal adoption or,in the case of revision,the year of last revision.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon()indicates an editorial change since the last revision or reapproval.This standard has been approved for use by agencies of the U.S.Department of Defense.1.Scope1.1 This test method provides a procedure for evaluatingthermal endurance of flexible sheet materials by determiningdielectric breakdown voltage at room temperature after agingin air at selected elevated temperatures.Thermal endurance isexpressed in terms of a temperature index.1.2 This test method is applicable to such solid electricalinsulating materials as coated fabrics,dielectric films,compos-ite laminates,and other materials where retention of flexibilityafter heat aging is of major importance(see Note 4).1.3 This test method is not intended for the evaluation ofrigid laminate materials nor for the determination of thermalendurance of those materials which are not expected orrequired to retain flexibility in actual service.1.4 The values stated in acceptable metric units are to beregarded as the standard.The values in parentheses are forinformation only.1.5 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.For a specifichazard statement,see 10.1.2.Referenced Documents2.1 ASTM Standards:2D149 Test Method for Dielectric Breakdown Voltage andDielectric Strength of Solid Electrical Insulating Materialsat Commercial Power FrequenciesD374 Test Methods for Thickness of Solid Electrical Insu-lation(Withdrawn 2013)3D5423 Specification for Forced-Convection Laboratory Ov-ens for Evaluation of Electrical Insulation2.2 Institute of Electrical and Electronics Engineers Publi-cations:4IEEE No.1 General Principles for Temperature Limits in theRating of Electrical EquipmentIEEE No.101A Guide for the Statistical Analysis of Ther-mal Life Test Data(including Appendix A)2.3 IEC Publications:IEC 216 Guide for the Determination of Thermal EnduranceProperties of Electrical Insulating Materials(Parts 1 and2)53.Terminology3.1 Definitions:3.1.1 temperature index,na number which permits com-parison of the temperature/time characteristics of an electricalinsulating material,or a simple combination of materials,basedon the temperature in degrees Celsius which is obtained byextrapolating the Arrhenius plot of life versus temperature to aspecified time,usually 20 000 h.3.1.2 thermal life,nthe time necessary for a specificproperty of a material,or simple combination of materials,todegrade to a defined end point when aged at a specifictemperature.3.1.3 thermal life curve,na graphical representation ofthermal life at a specified aging temperature in which the valueof a property of a material,or a simple combination ofmaterials,is measured at room temperature and the valuesplotted as a function of time.3.2 Definitions of Terms Specific to This Standard:1This test method is under the jurisdiction of ASTM Committee D09 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.19 on Dielectric Sheet and Roll ProductsCurrent edition approved Jan.1,2012.Published January 2012.Originallyapproved in 1961.Last previous edition approved in 2005 as D1830 99(2005).DOI:10.1520/D1830-99R12.2For referenced ASTM standards,visit the ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards volume information,refer to the standards Document Summary page onthe ASTM website.3The last approved version of this historical standard is referenced onwww.astm.org.4Available from Institute of Electrical and Electronics Engineers,Inc.(IEEE),445 Hoes Ln.,P.O.Box 1331,Piscataway,NJ 08854-1331.5Available from American National Standards Institute(ANSI),25 W.43rd St.,4th Floor,New York,NY 10036.Copyright ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959.United States1 3.2.1 thermal endurance grapha straight-line plot of thelogarithm of thermal life in hours versus the reciprocal of theabsolute aging temperature in kelvins(also known as theArrhenius plot).4.Summary of Test Method4.1 Specimens are aged in air at a minimum of threetemperatures above the expected use temperature of the mate-rial.Dielectric breakdown voltage tests in air at room tempera-ture are periodically made to determine the time of aging ateach test temperature required to reduce the breakdown voltageto a value of 12 kV/mm(300 V/mil)of original thic