ASTM_E_2544_-_11a.pdf

Designation:E254411aStandard Terminology forThree-Dimensional(3D)Imaging Systems1This standard is issued under the fixed designation E2544;the number immediately following the designation indicates the year oforiginal adoption or,in the case of revision,the year of last revision.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon()indicates an editorial change since the last revision or reapproval.1.Scope1.1 This terminology contains common terms,definitions ofterms,descriptions of terms,nomenclature,and acronymsassociated with three-dimensional(3D)imaging systems in aneffort to standardize terminology used for 3D imaging systems.1.2 The definitions of the terms presented in 3.1 are ob-tained from various standard documents developed by variousstandards development organizations.The intent is not tochange these universally accepted definitions but to gather,ina single document,terms and their definitions that may be usedin current or future standards for 3D imaging systems.1.2.1 In some cases,definitions of the same term from twostandards have been presented to provide additional reference.The text in parentheses to the right of each defined term is thename(and,in some cases,the specific section)of the source ofthe definition associated with that term.1.3 The definitions in 3.2 are specific terms developed bythis committee for 3D imaging systems.Some terms may havegenerally accepted definitions in a particular community or aredefined in existing standards.If there are conflictingdefinitions,our preference is to adapt(modify)the ISOstandard(if available)for this standard.1.4 A definition in this terminology is a statement of themeaning of a word or word group expressed in a singlesentence with additional information included in notes ordiscussions.1.5 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.NOTE1The subcommittee responsible for this standard will reviewdefinitions on a five-year basis to determine if the definition is stillappropriate as stated.Revisions will be made when determined necessary.2.Referenced Documents2.1 ASTM Standards:2E456 Terminology Relating to Quality and Statistics2.2 ASME Standard:3B89.4.19 Performance Evaluation of Laser Based SphericalCoordinate Measurement Systems2.3 ISO Standard:4VIM International vocabulary of metrology-Basic andgeneral concepts and associated termsISO 111461 Lasers and laser-related equipment Testmethods for laser beam widths,divergence angles andbeam propagation ratios Part 1:Stigmatic and simpleastigmatic beams2.4 NIST/SEMATECH Standard:5NIST/SEMATECH e-Handbook of Statistical Methods3.Terminology3.1 Definitions:accuracy of measurement,ncloseness of the agreementbetween the result of a measurement and a true value of themeasurand.(VIM 3.5)DISCUSSION(1)Accuracy is a qualitative concept.(2)The term“precision”should not be used for“accuracy.”bias(of a measuring instrument),nsystematic error of theindication of a measuring instrument.(VIM 3.25)DISCUSSION(1)The bias of a measuring instrument is normally esti-mated by averaging the error of indication over an appropriatenumber of repeated measurements.1This terminology is under the jurisdiction of Committee E57 on 3D ImagingSystems and is the direct responsibility of Subcommittee E57.01 on Terminology.Current edition approved May 15,2011.Published June 2011.Originallyapproved in 2007.Last previous edition approved in 20110 as E2544 11.DOI:10.1520/E2544-11A.2For referenced ASTM standards,visit the ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards volume information,refer to the standards Document Summary page onthe ASTM website.3Available from American Society of Mechanical Engineers(ASME),ASMEInternational Headquarters,Three Park Ave.,New York,NY 10016-5990,http:/www.asme.org.4Available from American National Standards Institute(ANSI),25 W.43rd St.,4th Floor,New York,NY 10036,http:/www.ansi.org.5Available from National Institute of Standards and Technology(NIST),100Bureau Dr.,Stop 1070,Gaithersburg,MD 20899-1070,http:/www.nist.gov.e-Handbook available at http:/www.itl.nist.gov/div898/handbook/.Copyright ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959.United States1 bias,ndifference between the average or expected value of adistribution and the true value.(NIST/SEMATECH e-Handbook)DISCUSSION(1)In metrology,the difference between precision andaccuracy is that measures of precision are not affected by bias,whereas accuracy measures degrade as bias increases.calibration,nset of operations that establish,under specifiedconditions,the relationship between values of quantitiesindicated by a measuring instrument or measuring system,orvalues represented by a material m