ASTM_E_2039_-_04.pdf

Designation:E 2039 04Standard Test Method forDetermining and Reporting Dynamic Dielectric Properties1This standard is issued under the fixed designation E 2039;the number immediately following the designation indicates the year oforiginal adoption or,in the case of revision,the year of last revision.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon(e)indicates an editorial change since the last revision or reapproval.1.Scope1.1 This test method describes the gathering and reportingof dynamic dielectric data.It incorporates laboratory testmethod for determining dynamic dielectric properties of speci-mens subjected to an oscillatory electric field using a variety ofdielectric sensor/cell configurations on a variety of instrumentscalled dielectric,microdielectric,DETA(DiElectric ThermalAnalysis),or DEA(DiElectric Analysis)analyzers.1.2 This test method determines permittivity,loss factor,ionic conductivity(or resistivity),dipole relaxation times,andtransition temperatures,and is intended for materials that havea relative permittivity in the range of 1 to 105;loss factors inthe range of 0 to 108;and,conductivities in the range 1016to1010S/cm.1.3 The test method is primarily useful when conductedover a range of temperatures for nonreactive systems(160Cto degradation)and over time(and temperature)for reactivesystems and is valid for frequencies ranging from 1 mHz to 100kHz.1.4 Apparent discrepancies may arise in results obtainedunder differing experimental conditions.Without changing theobserved data,completely reporting the conditions(as de-scribed in this test method)under which the data wereobtained,in full,will enable apparent differences observed inanother study to be reconciled.1.5SI units are the standard.1.6 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.Specific precau-tionary statements are given in Section 10.2.Referenced Documents2.1 ASTM Standards:2D 150 Test Method forA-C Characteristics and Permittivity(Dielectric Constant)of Solid Electrical Insulating Mate-rialsE 473 Terminology Relating to Thermal AnalysisE 1142 Terminology Relating to Thermophysical PropertiesE 2038 Test Method for Temperature Calibration of Dielec-tric Analyzers3.Terminology3.1 Definitions:3.1.1 The following technical terms are applicable to thisdocument and are defined in Terminologies E 473 and E 1142:dielectric thermal analysis,angular frequency,capacitance,conductivity,dielectric constant,dielectric dissipation factor,dielectric loss angle,dipole relaxation time,dissipation factor,frequency,loss factor,permittivity,phase angle,and tangentdelta.3.1.2 Relative permittivity and loss factor are dimensionlessquantities and are relative to the permittivity of free space(e0=8.854 pF/m).Relative permittivity also is known as thedielectric constant.3.2 Definitions of Terms Specific to This Standard:3.2.1 dielectric(or microdielectric)sensor,na set of atleast two(perhaps three)contacting electrodes for measuringthe dielectric response of materials.3.2.1.1 DiscussionThe sensor generally consists of paral-lel,circular,conducting(metallic)plates or discs,betweenwhich the sample is placed.The sensor also may be a set ofinterdigitated conductors on an insulating substrate.In somecases,the sensor may incorporate amplifying electronics or atemperature sensing device(see Fig.1),or both.3.2.2 interdigitated electrode,nan electrode configurationconsisting of two nonconnected,interpenetrating conductorsfirmly attached to an insulating substrate and exposed to thespecimen on top.3.2.2.1 DiscussionInterdigitated electrodes of differentgeometry are available,such as,interpenetrating“fingers”or“combs,”interpenetrating circular spirals,or interpenetratingsquare spirals(see Fig.1).Whereas parallel plate electrodes contact a specimen on a“top”and“bottom”surface,the interdigitated electrodes make contact on onlyone side(single-sided contact)of the specimen.1This test method is under the jurisdiction ofASTM Committee E37 on ThermalMeasurements and is the direct responsibility of Subcommittee E37.01 on TestMethods and Recommended Practices.Current edition approved Feb.1,2004.Published March 2004.Originallyapproved in 1999.Last previous edition approved in 1999 as E 203999.2For referenced ASTM standards,visit the ASTM website,www.astm.org,orcontact ASTM Customer Service at serviceastm.org.For Annual Book of ASTMStandards volume information,refer to the standards Document Summary page onthe ASTM website.1Copyright ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959,United States.3.2.3 electrode spacing(ES),nfor interdigitated elec-trodes,the width of the insulator strip between adjacentelectrodes in the electrode array(see Fig.1).3.2.4 electrode width(EW),nfor in