ASTM_E_1036M_-_96e2.pdf

Designation:E 1036M 96e2METRICStandard Test Methods forElectrical Performance of Nonconcentrator TerrestrialPhotovoltaic Modules and Arrays Using Reference CellsMetric1This standard is issued under the fixed designation E 1036M;the number immediately following the designation indicates the year oforiginal adoption or,in the case of revision,the year of last revision.A number in parentheses indicates the year of last reapproval.Asuperscript epsilon(e)indicates an editorial change since the last revision or reapproval.e1NOTEDesignation was corrected editorially in July 1996.e2NOTEDesignation was corrected editorially in December 1996.1.Scope1.1 These test methods cover the electrical performance ofphotovoltaic modules and arrays under natural or simulatedsunlight using a calibrated reference cell.1.2 Measurements under a variety of conditions are al-lowed;results are reported under a select set of reportingconditions(RC)to facilitate comparison of results.1.3 These test methods apply only to nonconcentrator ter-restrial modules and arrays.1.4 The performance parameters determined by these testmethods apply only at the time of the test,and imply no past orfuture performance level.1.5 There is no similar or equivalent ISO standard.1.6 This standard does not purport to address all of thesafety concerns,if any,associated with its use.It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use.2.Referenced Documents2.1 ASTM Standards:E 691 Practice for Conducting an Interlaboratory Study toDetermine the Precision of a Test Method2E 772 Terminology Relating to Solar Energy Conversion3E 891 Tables for Terrestrial Direct Normal Solar SpectralIrradiance for Air Mass 1.52E 892 Tables for Terrestrial Solar Spectral Irradiance at AirMass 1.5 for a 37 Tilted Surface2E 927 Specification for Solar Simulation for TerrestrialPhotovoltaic Testing3E 941 Test Method for Calibration of Reference Pyranom-eters With Axis Tilted by the Shading Method2E 948 Test Method for Electrical Performance of Photovol-taic Cells Using Reference Cells Under Simulated Sun-light3E 973 Test Method for Determination of the Spectral Mis-match Parameter Between a Photovoltaic Device and aPhotovoltaic Reference Cell3E 1021 Test Methods for Measuring the Spectral Responseof Photovoltaic Cells3E 1039 Test Method for Calibration of Silicon Non-Concentrator Photovoltaic Primary Reference Cells UnderGlobal Irradiation3E 1040 Specification for Physical Characteristics of Non-concentrator Terrestrial Photovoltaic Reference Cells3E 1125 Test Method for Calibration of Primary Nonconcen-trator Terrestrial Photovoltaic Reference Cells Using aTabular Spectrum3E 1328 Terminology Relating to Photovoltaic Solar EnergyConversion3E 1362 Test Method for Calibration of NonconcentratorPhotovoltaic Secondary Reference Cells33.Terminology3.1 DefinitionsDefinitions of terms used in these testmethods may be found in Terminology E 772 and TerminologyE 1328.3.2 Definitions of Terms Specific to This Standard:3.2.1 nominal operating cell temperature,NOCT,nthetemperature of a solar cell inside a module operating at anambient temperature of 20C,an irradiance of 800 Wm2,andan average wind speed of 1 ms1.3.2.2 reporting conditions,RC,nthe device temperature,total irradiance,and reference spectral irradiance conditionsthat module or array performance data are corrected to.1These test methods are under the jurisdiction of ASTM Committee E-44 onSolar,Geothermal,and Other Alternative Energy Sources and are the directresponsibility of Subcommittee E44.09 on Photovoltaic Electric Power Conversion.Current edition approved June 10,1996.Published July 1996.Originallypublished as E 1036 85.Last previous edition E 1036 93.2Annual Book of ASTM Standards,Vol 14.02.3Annual Book of ASTM Standards,Vol 12.02.1Copyright ASTM International,100 Barr Harbor Drive,PO Box C700,West Conshohocken,PA 19428-2959,United States.3.3 Symbols:Symbols:3.3.1 The following symbols and units are used in these testmethods:artemperature coefficient of reference cell ISC,C1,a(E)current temperature function of device under test,C1,b(E)voltage temperature function of device under test,C1,Ccalibration constant of reference cell,Am2W1,C8adjusted calibration constant of reference cell,Am2W1,CfNOCT Correction factor,C,d(T)voltage irradiance correction function of device undertest,dimensionless,DTNOCT cell-ambient temperature difference,C,Eirradiance,Wm2,Eoirradiance at RC,Wm2,FFfill factor,dimensionless,Icurrent,A,Impcurrent at maximum power,A,Iocurrent at RC,A,Irshort-circuit current of reference cell,A,Iscshort-circuit current,A,Mspectral mismatch parameter,dimensionless,Pelectrical power,W,Pmmaximum power,W,Ttemperature,C,Taambient temperature,C,Tctemperature of cell in module,C,Totemperature at RC,C,Trtemperature of reference cell,C,nwind speed,ms1,Vvoltage,V,Vmpvoltage at maximum power,V,Vovoltage at RC,V,