ASME_B46.1-2019.pdf

Surface Texture(Surface Roughness,Waviness,and Lay)AN INTE R NAT IO NAL STANDARDASME B46.1-2019(Revision of ASME B46.1-2009)ASME B46.1-2019(Revision of ASME B46.1-2009)Surface Texture(Surface Roughness,Waviness,and Lay)AN INTERNATIONAL STANDARDTwo Park Avenue New York,NY 10016 USAxDate of Issuance:June 30,2020The next edition of this Standard is scheduled for publication in 2025.ASME issues written replies to inquiries concerning interpretations of technical aspects of this Standard.Interpretations arepublishedontheCommitteewebpageandunderhttp:/go.asme.org/InterpsDatabase.PeriodicallycertainactionsoftheASMEB46 Committee may be published as Cases.Cases are published on the ASME website under the B46 Committee Page athttp:/go.asme.org/B46committee as they are issued.Errata to codes and standards may be posted on the ASME website under the Committee Pages to provide corrections toincorrectlypublisheditems,ortocorrecttypographicalorgrammaticalerrorsincodesandstandards.Sucherratashallbeusedon the date posted.The B46 Committee Page can be found at http:/go.asme.org/B46committee.There is an option available to automaticallyreceive an e-mail notification when errata are posted to a particular code or standard.This option can be found on theappropriate Committee Page after selecting“Errata”in the“Publication Information”section.ASME is the registered trademark of The American Society of Mechanical Engineers.This international code or standard was developed under procedures accredited as meeting the criteria for American National StandardsanditisanAmericanNationalStandard.TheStandardsCommitteethatapprovedthecodeorstandardwasbalancedtoassurethatindividualsfromcompetentandconcernedinterestshavehadanopportunitytoparticipate.Theproposedcodeorstandardwasmadeavailableforpublicreviewandcommentthatprovidesanopportunityforadditionalpublicinputfromindustry,academia,regulatoryagencies,andthepublic-at-large.ASME does not“approve,”“rate,”or“endorse”any item,construction,proprietary device,or activity.ASME does not take any position with respect to the validity of any patent rights asserted in connection with any items mentioned in thisdocument,anddoesnotundertaketoinsureanyoneutilizingastandardagainstliabilityforinfringementofanyapplicableletterspatent,norassumeanysuchliability.Usersofacodeorstandardareexpresslyadvisedthatdeterminationofthevalidityofanysuchpatentrights,andtherisk of infringement of such rights,is entirely their own responsibility.Participation by federal agency representative(s)or person(s)affiliated with industry is not to be interpreted as government or industryendorsement of this code or standard.ASME accepts responsibility for only those interpretations of this document issued in accordance with the established ASME proceduresand policies,which precludes the issuance of interpretations by individuals.No part of this document may be reproduced in any form,in an electronic retrieval system or otherwise,without the prior written permission of the publisher.The American Society of Mechanical EngineersTwo Park Avenue,New York,NY 10016-5990Copyright 2020 byTHE AMERICAN SOCIETY OF MECHANICAL ENGINEERSAll rights reservedPrinted in U.S.A.CONTENTSForeword.ixCommittee Roster.xiCorrespondence With the B46 Committee.xiiExecutive Summary.xivSummary of Changes.xvSection 1Terms Related to Surface Texture.11-1General.11-2Definitions Related to Surfaces.11-3Definitions Related to the Measurement of Surface Texture by Profiling Methods.31-4Definitions of Surface Parameters for Profiling Methods.61-5Definitions Related to the Measurement of Surface Texture by Area Profiling and AreaAveraging Methods.151-6Definitions of Surface Parameters for Area Profiling and Area Averaging Methods.16Section 2Classification of Instruments for Surface Texture Measurement.212-1Scope.212-2Recommendation.212-3Classification Scheme.22Section 3Terminology and Measurement Procedures for Profiling,Contact,SkidlessInstruments.243-1Scope.243-2References.243-3Terminology.243-4Measurement Procedure.29Section 4Measurement Procedures for Contact,Skidded Instruments.314-1Scope.314-2References.314-3Purpose.314-4Instrumentation.31Section 5Measurement Techniques for Area Profiling.365-1Scope.365-2References.365-3Recommendations.365-4Imaging Methods.365-5Scanning Methods.36Section 6Measurement Techniques for Area Averaging.376-1Scope.376-2Examples of Area Averaging Methods.37iiiSection 7Nanometer Surface Texture and Step Height Measurements by Stylus ProfilingInstruments.387-1Scope.387-2Applicable Documents.387-3Definitions.387-4Recommendations.397-5Preparation for Measurement.407-6Calibration Artifacts.417-7Reports.42Section 8Nanometer Surface Roughness as Measured With Phase Measuring InterferometricMicroscopy.438-1Scope.438-2Description and Definitions:Noncontact Phase Measuring Interferometer.438-3Key Sources of Uncertainty.438-4Noncontact Phase Measuring Interferometer Instrument Requirements.458-5Test Methods.458-6Measurement Procedures.458-7Data Analysis a